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  1. Article

    Open Access

    Al5+αSi5+δN12, a new Nitride compound

    The family of III-Nitride semiconductors has been under intensive research for almost 30 years and has revolutionized lighting applications at the dawn of the 21st century. However, besides the developments an...

    R. Dagher, L. Lymperakis, V. Delaye, L. Largeau, A. Michon, J. Brault in Scientific Reports (2019)

  2. Article

    Open Access

    Intentional polarity conversion of AlN epitaxial layers by oxygen

    Nitride materials (AlN, GaN, InN and their alloys) are commonly used in optoelectronics, high-power and high-frequency electronics. Polarity is the essential characteristic of these materials: when grown along...

    N. Stolyarchuk, T. Markurt, A. Courville, K. March, J. Zúñiga-Pérez in Scientific Reports (2018)

  3. No Access

    Article

    Correlation Between the AlN Buffer Layer Thickness and the GaN Polarity in GaN/AlN/Si(111) Grown by MBE

    In this work it is shown that thin AlN buffer layers cause N-polarity GaN epilayers, with a high inversion domains density. When the AlN thickness increases, the polarity of the epilayer changes to Ga. The use...

    A. M. Sanchez, P. Ruterana, P. Vennegues, F. Semond in MRS Online Proceedings Library (2011)

  4. Article

    Open Access

    Filtering of Defects in Semipolar (11−22) GaN Using 2-Steps Lateral Epitaxial Overgrowth

    Good-quality (11−22) semipolar GaN sample was obtained using epitaxial lateral overgrowth. The growth conditions were chosen to enhance the growth rate along the [0001] inclined direction. Thus, the coalescenc...

    N Kriouche, M Leroux, P Vennéguès, M Nemoz, G Nataf in Nanoscale Research Letters (2010)

  5. No Access

    Article

    Symmetry and optical properties of wurtzite nanostructures with the c axis in the layer plane

    In wurtzite-based quantum wells and superlattices with the c axis parallel to the layer plane, this plane is parallel either to a symmetry plane of the wurtzite lattice (type I structures, the 〈11 ...

    P. Tronc, P. Vennéguès in Physics of the Solid State (2008)

  6. No Access

    Chapter and Conference Paper

    Structural and morphological characterization of GaN/AlGaN quantum dots by transmission electron microscopy

    In recent years much attention has been devoted to GaN quantum dots (QDs) due to their potential application as light emitting diodes and lasers diodes operating in the ultra-violet range. QDs allow carriers l...

    M. Korytov, M. Benaissa, J. Brault in EMC 2008 14th European Microscopy Congress… (2008)

  7. No Access

    Chapter and Conference Paper

    Contribution of low tension ion-milling to heterostructural semiconductors preparation

    Specimens of superior quality are required for quantitative Transmission Electron Microscopy. The classical preparation of heterostructural semiconductors includes stages of mechanical polishing followed by io...

    M. Korytov, O. Tottereau, J. M. Chauveau in EMC 2008 14th European Microscopy Congress… (2008)

  8. No Access

    Chapter and Conference Paper

    STEM investigations of (In,Ga)N/GaN quantum wells

    Nanostructures of III-N semiconductors have a great commercial potential due to their optoelectronic properties. The structural and chemical characteristics of such structures determine the performance of the ...

    P. Manolaki, I. Häusler, H. Kirmse in EMC 2008 14th European Microscopy Congress… (2008)

  9. No Access

    Article

    Growth and characterization of A-plane ZnO and ZnCoO based heterostructures

    Non polar ZnO and (Zn, Co)O layers were successfully grown on (11̄02) sapphire (R-plane sapphire). The growth process was shown to directly influence the surface morphology as well as the strain state in (112̄...

    J.-M. Chauveau, C. Morhain, B. Lo, B. Vinter, P. Vennéguès, M. Laügt in Applied Physics A (2007)

  10. No Access

    Article

    X-ray and transmission electron microscopy characterization of twinned CdO thin films grown on a-plane sapphire by metalorganic vapour phase epitaxy

    In the frame of studying II–VI oxides of interest in optoelectronic technologies, the structural properties of CdO films grown by metalorganic vapour phase epitaxy on a-plane sapphire substrates have been anal...

    M.C. Martínez-Tomás, J. Zúñiga-Pérez, P. Vennéguès, O. Tottereau in Applied Physics A (2007)

  11. No Access

    Chapter and Conference Paper

    Strain relaxation in (Al,Ga)N/GaN heterostructures

    Strain relaxation mechanisms in metal-organic vapour phase epitaxy grown (Al,Ga)N/GaN heterostructures are presented. Relaxation first occurs through a 2D–3D transition. For pure AlN, misfit a-type dislocations a...

    P Vennéguès, J M Bethoux, Z Bougrioua, M Azize in Microscopy of Semiconducting Materials (2005)

  12. No Access

    Article

    Molecular beam epitaxy of ZnxBe1−xSe: Influence of the substrate nature and epilayer properties

    We have studied the heteroepitaxial growth of ZnxBe1−xSe onto Si, GaAs and GaP substrates. By comparing the growth on these different substrates, we showed that lattice-matching is not a sufficient condition to a...

    C. Chauvet, E. Tournié, P. Vennéguès, J. P. Faurie in Journal of Electronic Materials (2000)

  13. No Access

    Article

    Comparative Study of Gan Movpe Growth Processes Using Two Different “Surface Preparation-Carrier Gas” Combinations

    The growth modes and resulting microstructures of GaN films grown by Metalorganic Vapor Phase Epitaxy (MOVPE) on (0001) sapphire with either a simple nitridation of the surface and N2 as carrier gas or with a tre...

    P. Vennegues, S. Haffouz, A. Bouille, M. Leroux in MRS Online Proceedings Library (1998)

  14. Article

    Mg-enhanced lateral overgrowth of GaN on patterned GaN/sapphire substrate by selective Metal Organic Vapor Phase Epitaxy

    Selective and lateral overgrowth by Metal Organics Vapour Phase Epitaxy (MOVPE) was carried out until coalescence to produce smooth and optically flat thick GaN layers. A GaN epitaxial layer is first grown usi...

    B. Beaumont, M. Vaille, G. Nataf, A. Bouillé in MRS Internet Journal of Nitride Semiconduc… (1998)

  15. No Access

    Article

    Effect of the Nitridation of the Sapphire (0001) Substrate on the GaN Growth

    The analysis of the sapphire surface nitridation by in situ reflection high-energy electron diffraction evidences the formation of a relaxed AIN layer. Its role on the early stage of the GaN growth is investigate...

    N. Grandjean, J. Massies, P. Vennègues, M. Laugt in MRS Online Proceedings Library (1996)

  16. No Access

    Article

    Plan-view microstructures of Co/Ru bilayers

    Plan-view microstructures of two Co/Ru bilayers with a composition of [Co12ÅRu45Å]2 and [Co40ÅRu35Å]2 have been studied by conventional and high resolution electron microscopy. Large differences in electron diffr...

    G. Z. Pan, A. Michel, V. Pierron-Bohnes, P. Vennéguès in Journal of Materials Research (1995)

  17. No Access

    Article

    Kinetics of SRO and LRO in FeAl Alloys with A2 and DO3 Structures

    The kinetics of short and long-range ordering in FeA1x alloys have been investigated using resistometry. The results were obtained in the A2 solid solution (x = 0.10 and 0.17), in the DO3 ordered phase (x = 0.23,...

    M. C. Cadeville, V. Pierron-Bohnes, P. Vennegues in MRS Online Proceedings Library (1990)