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    Article

    Gettering Effect in Cr/4H–SiC UV Photodetectors under Ptoton Irradiation with E = 15 MeV

    The mechanism of structure transformation in Cr/4H–SiC UV photo detectors, which is responsi-ble for the cyclic gettering of radiation defects, under repeated proton irradiation, is proposed in this work.

    I. P. Nikitina, E. V. Kalinina, V. V. Zabrodski in Technical Physics (2023)

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    Article

    Templates for Homoepitaxial Growth of 3C-SiC Obtained by Direct Bonding of Silicon Carbide Wafers of Differing Polytype

    An approach of direct bonding of SiC wafers of differing polytypes has been implemented in order to create a template for cubic 3C-SiC homo epitaxy. Hetero epitaxial 3C-SiC layers grown by chemical vapor depositi...

    M. G. Mynbaeva, D. G. Amelchuk, A. N. Smirnov, I. P. Nikitina in Semiconductors (2023)

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    Article

    Study of Heavily Doped n-3C-SiC Epitaxial Films Grown on 6H-SiC Semi-Insulating Substrates by Sublimation Method

    Heavily doped 3C-SiC films based on semi-insulating 6H-SiC substrates were obtained by sublimation epitaxy. The structural perfection of the obtained samples was monitored by X-ray diffractometry. The measurement...

    A. A. Lebedev, V. Yu. Davydov, I. A. Eliseev, S. P. Lebedev in Semiconductors (2023)

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    Article

    Irradiation with Argon Ions of Cr/4H-SiC Photodetectors

    The results of the effect of irradiation with Ar ions on the structural, electrophysical, and optical characteristics of ultraviolet Cr/4H-SiC photodetectors in the spectral range 200 to 400 nm are presented. Aft...

    E. V. Kalinina, M. F. Kudoyarov, I. P. Nikitina, E. V. Dementyeva in Semiconductors (2022)

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    Article

    Structural, Electrical, and Optical Properties of 4H–SiC for Ultraviolet Photodetectors

    The results of investigations of initial n-4H–SiC structures by various methods are presented. The structures represent a highly doped n+ substrate with epitaxial layers 5 μm thick grown by chemical vapor deposit...

    E. V. Kalinina, A. A. Katashev, G. N. Violina, A. M. Strelchuk in Semiconductors (2020)

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    Article

    Structural and Optical Characteristics of 4H-SiC UV Detectors Irradiated with Argon Ions

    The results of a study into the effect of irradiation with heavy Ar ions on the structural and optical characteristics of 4H-SiC are presented. It is shown that even upon single-time irradiation with 53-MeV Ar io...

    E. V. Kalinina, M. F. Kudoyarov, I. P. Nikitina, E. V. Ivanova in Semiconductors (2020)

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    Article

    Effect of Temperature on the Characteristics of 4H-SiC UV Photodetectors

    The influence exerted by the carrier concentration in the range (1–50) × 1014 cm–3 in n-4H-SiC chemical-vapor deposited (CVD) epitaxial layers on the spectral characteristics of UV photodetectors with Cr Schottky...

    E. V. Kalinina, G. N. Violina, I. P. Nikitina, E. V. Ivanova in Semiconductors (2020)

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    Article

    Proton Irradiation of 4H-SiC Photodetectors with Schottky Barriers

    For the first time, comprehensive comparative investigations of ultraviolet photodetectors with Cr Schottky barriers formed on 4H-SiC epitaxial layers are carried out by the X-ray and optical methods before and a...

    E. V. Kalinina, G. N. Violina, I. P. Nikitina, M. A. Yagovkina in Semiconductors (2019)

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    Article

    A Study of the Influence Exerted by Structural Defects on Photoluminescence Spectra in n-3C-SiC

    Photoluminescence (PL) spectra have been studied in 3C-SiC/4H-SiC heterostructures and 3C‑SiC single crystals. It was shown that epitaxial 3C-SiC layers grown on 4H-SiC substrates have a markedly poorer crystal p...

    A. A. Lebedev, I. P. Nikitina, N. V. Seredova, N. K. Poletaev in Technical Physics Letters (2019)

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    Article

    Effects of irradiation with 8-MeV protons on n-3C-SiC heteroepitaxial layers

    The effects of 8-MeV proton irradiation on n-3C-SiC epitaxial layers grown by sublimation on semi-insulating 4H-SiC substrates are studied. Changes in the sample parameters were recorded by the Hall-effect method...

    A. A. Lebedev, B. Ya. Ber, G. A. Oganesyan, S. V. Belov, S. P. Lebedev in Semiconductors (2017)

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    Article

    Chloride epitaxy of β-Ga2O3 layers grown on c-sapphire substrates

    The method of chloride epitaxy is employed to grow β-Ga2O3 epitaxial layers on a c-sapphire substrate. Purified dry air is used as the source of oxygen. The layers are studied using the methods of X-ray diffracti...

    V. I. Nikolaev, A. I. Pechnikov, S. I. Stepanov, Sh. Sh. Sharofidinov in Semiconductors (2016)

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    Article

    On a reduction in cracking upon the growth of AlN on Si substrates by hydride vapor-phase epitaxy

    The main problem of the epitaxial growth of thick AlN layers on a Si substrate consists in the formation of cracks, which complicates the application of structures of this kind in the fabrication of semiconduc...

    Sh. Sh. Sharofidinov, V. I. Nikolaev, A. N. Smirnov, A. V. Chikiryaka in Semiconductors (2016)

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    Article

    Investigation of the structure of (p)3C-SiC-(n)6H-SiC heterojunctions

    The structure of (p)3C-SiC-(n)6H-SiC epitaxial structures obtained by sublimation epitaxy in vacuum on 6H-SiC substrates was studied by methods of X-ray topography, X-ray diffraction, and transmission electron mi...

    A. A. Lebedev, G. N. Mosina, I. P. Nikitina, N. S. Savkina in Technical Physics Letters (2001)

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    Article

    Electrical characteristics and structural properties of ohmic contacts to p-type 4H-SiC epitaxial layers

    Epitaxial films grown by low-temperature liquid phase epitaxy on p-type 4H-SiC were used as strongly doped subcontact layers for making low-resistance contacts to the p-type material. The layers had a bulk resist...

    K. V. Vasilevskii, S. V. Rendakova, I. P. Nikitina, A. I. Babanin in Semiconductors (1999)

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    Article

    GaInAsSb/GaSb heterostructures grown in the spinodal decay region by liquid-phase epitaxy from Sb-enriched solution-melts

    Nearly isoperiodic solitary Ga1−x InxAsySb1−y /GaSb heterostructures, in which the composition of the solid solution should be found inside the region of spinodal decay (x⩽0.4), were grown by liquid-phase epitaxy...

    V. I. Vasil’ev, D. Akhmedov, A. G. Geryagin, V. I. Kuchinskii in Semiconductors (1999)

  16. No Access

    Article

    Physical properties of bulk single-crystal wafers of gallium nitride

    A study has been performed of the crystalline structure and optical characteristics of single crystals of gallium nitride (GaN). The crystals were grown from a gallium-based flux. X-ray structural analysis sho...

    V. A. Ivantsov, V. A. Sukhoveev, V. I. Nikolaev in Physics of the Solid State (1997)

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    Chapter and Conference Paper

    Liquid Phase Epitaxy of SiC-AlN Solid Solutions

    In this paper we described (SiC)1−x(AlN)x layers and pn structures grown by container free liquid phase epitaxy. Auger measurements have indicated that the concentration of the AlN component in the epitaxial laye...

    V. A. Dmitriev, L. B. Elfimov in Amorphous and Crystalline Silicon Carbide … (1992)

  18. No Access

    Chapter and Conference Paper

    Growth of Cubic Silicon Carbide on Silicon Using the C2HCl3-SiH4-H2 System

    Cubic silicon carbide is a widegap semiconductor whose chemical and physical properties make it applicable for fabrication of electronic devices operating in extreme environments: high temperature, radiation e...

    I. M. Baranov, V. A. Dmitriev in Amorphous and Crystalline Silicon Carbide … (1992)

  19. No Access

    Chapter and Conference Paper

    Structural Defects in Epitaxial Layers SiC-3C/Si Grown by CVD

    The present, study reports research results of a dislocation structure of epitaxial layers SiC-3C/Si, grown by CVD without a buffer layer and by “buffer” technology. X-ray differential diffractometry and TEM w...

    R. N. Kyutt, I. P. Nikitina, S. S. Ruvimov in Amorphous and Crystalline Silicon Carbide … (1992)