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  1. No Access

    Article

    Precipitation hardening and recrystallization in Cu-4% to 7% Ni-3% Al alloys

    The effects of microstructure on mechanical properties in three cold-worked Cu-4% to 7% Ni-3% Al alloys have been investigated by changing ageing time at 500 °C. Hardness and strength in the Cu-7% Ni-3% Al and...

    Young-Rae Cho, Young-Ho Kim, Taek Dong Lee in Journal of Materials Science (1991)

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    Article

    Influence of Cu Deposition Conditions on the Microstructure and Adhesion of Cu/Cr Thin Film to Polyimide Film

    The microstructure of Cu thin films in various deposition conditions and the influence of their microstructure on the adhesion strength between Cu/Cr films and polyimides were studied. Cr films (50 nm thick) a...

    Cheol-Ho Joh, Young-Ho Kim in MRS Online Proceedings Library (1996)

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    Article

    A study on the development of engineering plastic piston used in the shock absorber

    A piston is an important component of the shock absorber which determines comfortable riding and handling. Conventional piston is made of metal powder that is pressed in a mold, and then sintered at high tempe...

    Young-Ho Kim, Won-Byong Bae, Dong-Ju Lim, Yun-Soo Suh in Metals and Materials (1998)

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    Article

    Microstructural change and interfacial reactions of Pt/Ti thin films on SiNx/Si during annealing in various ambients

    The microstructural changes and interfacial reactions of Pt/Ti/SiNx/Si during annealing were investigated using transmission electron microscopy (TEM), X-ray diffraction (XRD), and Auger electron spectroscopy (AE...

    Dong-Chan Kim, Tae Gon Lee, Young-Ho Kim in Journal of Materials Science: Materials in… (1999)

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    Article

    Analysis of 1/f noise in LWIR HgCdTe photodiodes

    We study the 1/f noise currents and dark currents in LWIR HgCdTe photodiodes. The measured dark currents of the diodes processed by post implantation annealing with different annealing times are analyzed using...

    Soo Ho Bae, Sang Jun Lee, Young Ho Kim, Hee Chul Lee in Journal of Electronic Materials (2000)

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    Article

    Surface leakage current analysis of ion implanted ZnS-passivated n-on-p HgCdTe diodes in weak inversion

    Effects of fixed charge on R0A value of ZnS-passivated x=0.3 HgCdTe n-on-p diode are explained as a shunt resistance that affects current-voltage (I-V) and dynamic resistance-voltage (Rd-V) characteristics. The f...

    Young-Ho Kim, Soo-Ho Bae, Hee Chul Lee, Choong Ki Kim in Journal of Electronic Materials (2000)

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    Article

    Characteristics of gradually doped LWIR diodes by hydrogenation

    The hydrogenation effects on HgCdTe diode performance are presented and the mechanism of hydrogenation is revealed. By the hydrogenation, R0A is increased by 30 times and photo-response is also improved. It is su...

    Young-Ho Kim, Tae-Sik Kim, D. A. Redfern, C. A. Musca in Journal of Electronic Materials (2000)

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    Article

    Texture enhancement of Al films on Ti underlayers by radio-frequency bias sputtering

    The influence of sputtering pressure and radio-frequency (RF) bias power on the texture of Al/Ti thin films has been investigated. The Al/Ti thin films were deposited sequentially onto thermally oxidized Si wa...

    Duk-Seo Park, Young-Ho Kim in Journal of Electronic Materials (2002)

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    Article

    Interfacial microstructure and intermetallics developed in the interface between in solders and Au/Ni/Ti thin films during reflow process

    Intermetallic phases and microstructures formed between In solder and Au/Ni/Ti thin films during reflow were characterized using x-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission el...

    Keesam Shin, Won-Gu Cho, Young-Ho Kim in Journal of Electronic Materials (2003)

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    Article

    Microstructure characterization of Sn-Ag solder joints between stud bumps and metal pads

    The microstructure of the flip-chip solder joints fabricated using stud bumps and Pb-free solder was characterized. The Au or Cu stud bumps formed on Al pads on Si die were aligned to corresponding metal pads ...

    Mu-Seob Shin, Young-Ho Kim in Journal of Electronic Materials (2003)

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    Article

    The microstructure characterization of ultrasmall eutectic Bi-Sn solder bumps on Au/Cu/Ti and Au/Ni/Ti under-bump metallization

    The microstructure of the ultrasmall eutectic Bi-Sn solder bumps on Au/Cu/Ti and Au/Ni/Ti under-bump metallizations (UBMs) was investigated as a function of cooling rate. The ultrasmall eutectic Bi-Sn solder b...

    Un-Byoung Kang, Young-Ho Kim in Journal of Electronic Materials (2004)

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    Article

    Contact resistance and shear strength of the solder joints formed using Cu bumps capped with Sn or Ag/Sn layer

    Solder joints were successfully bonded by joining Ag/Sn/Cu bumps and Ag/Sn/Cu layers at 200°C for 30 sec under 20 MPa, 40 MPa, and 80 MPa using thermo-compression bonder. The solder joints were aged at 150°C u...

    Seung-Hyun Lee, Hee-Ra Roh, Zhi Gang Chen, Young-Ho Kim in Journal of Electronic Materials (2005)

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    Article

    A comparison of gamma radiation effects on bromine- and hydrazine-treated HgCdTe photodiodes

    In this study, we investigated the effects of gamma radiation on ZnS/CdTe-passivated HgCdTe photodiodes that were fabricated with one of two different surface treatments using bromine, Br2, or hydrazine, N2H4. Un...

    Min Yung Lee, Young Ho Kim, Nam Ho Lee, Yong Soo Lee in Journal of Electronic Materials (2006)

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    Article

    Bottom electrode etching effect on the electrical properties of lead strontium titanate thin film

    (Pb0.4Sr0.6)TiO3 thin films were prepared by a modified sol-gel method on Pt/Ti/SiO2/Si substrates, where lower figure of merit of about 16% was observed in spite of higher tunability above 58%. The electrode sur...

    Dong Heon Kang, Sung Yoon Lee, Young Ho Kim, Sang Keun Gil in Journal of Electroceramics (2006)

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    Article

    Characteristics of the Interfacial Microstructure of Chip-on-Plastic Joints under Thermal Cycling and Aging Treatment

    This study presents the change of contact resistance and microstructure evolution of chip-on-plastic (COP) joints during the thermal cycling (T/C) test and aging treatment. Results showed that the average cont...

    Zhi Gang Chen, Young-Ho Kim in Journal of Electronic Materials (2007)

  16. No Access

    Article

    Nucleation and Growth of Zinc Particles on an Aluminum Substrate in a Zincate Process

    The nucleation and growth of zinc particles during a conventional zincate process were investigated. Zinc particles preferentially nucleated on the peak or edge of an aluminum surface and preferentially grew w...

    Sung-Ki Lee, Jae-Ho Lee, Young-Ho Kim in Journal of Electronic Materials (2007)

  17. No Access

    Article

    Improvement of LDI BUMP Strip** Process by Development of Room Temperature PR Stripper

    Bump process using gold bump led to many cleaning problems like polymer residues, metal and polyimide consumption after strip** process. First of all, strip** process of bump photoresist is one of the diff...

    Young- Sam Lim, Dong Chan Bae, Hyun-Joon Kim in MRS Online Proceedings Library (2007)

  18. No Access

    Article

    Dielectric properties of zinc titanate thin films prepared by Rf magnetron sputtering

    Zinc titanate thin films of ~500 nm in thickness were synthesized by an RF magnetron sputtering using a sintered ceramic target. After annealing in temperature ranges of 300–800 °C, their phase transition and ...

    ** Suk Jung, Young Ho Kim, Sang Keun Gil, Dong Heon Kang in Journal of Electroceramics (2009)

  19. No Access

    Article

    Mechanism of the Delayed Growth of Intermetallic Compound at the Interface between Sn−4.0Ag−0.5Cu and Cu−Zn Substrate

    A Cu−Zn wetting layer was very effective to depress the excessive growth of intermetallic compound (IMC). The effect of Zn addition to the Cu layer on the IMC growth and microvoid formation in the solder inter...

    Young Min Kim, Kyoung-Moo Harr, Young-Ho Kim in Electronic Materials Letters (2010)

  20. No Access

    Article

    Kinetics of Intermetallic Compound Formation at the Interface Between Sn-3.0Ag-0.5Cu Solder and Cu-Zn Alloy Substrates

    The growth kinetics of an intermetallic compound (IMC) layer formed between Sn-3.5Ag-0.5Cu (SAC) solders and Cu-Zn alloy substrates was investigated for samples aged at different temperatures. Scallop-shaped Cu6S...

    Young Min Kim, Hee-Ra Roh, Sungtae Kim, Young-Ho Kim in Journal of Electronic Materials (2010)

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