5 Result(s)
within
Conference Paper
M Gass
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Chapter and Conference Paper
Aberration corrected STEM and EELS: Atomic scale chemical map**
Scanning transmission electron microscopy (STEM) has enjoyed a recent surge in activity for two reasons. A long awaited improvement in the STEM performance of conventional TEM/STEM instruments coincided with t...
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Chapter and Conference Paper
Electron Microscopy Analysis of AlGaN/GaN Nanowires Grown by Catalyst-Assisted Molecular Beam Epitaxy
Scanning transmission electron microscopy has been used to investigate the composition of nickel seeds which promote the columnar growth of AlGaN / GaN nanowires deposited by molecular beam epitaxy (MBE) on sa...
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Chapter and Conference Paper
Structural and Compositional Properties of Strain-Symmetrized SiGe/Si Heterostructures
In this study, we have utilised conventional and aberration corrected (scanning) transmission electron microscopy to examine the Ge concentration across a series of technologically significant SiGe/Si prototyp...
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Chapter and Conference Paper
(S)TEM/EELS characterisation of a multilayer C/Cr PVD coating
Carbon based coatings have attracted considerable interest in a wide range of industries due to their excellent tribological properties. Nanoscale hydrogen free C/Cr coatings have been produced by unbalanced m...
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Chapter and Conference Paper
Structure and stability of core-shell AuAg nanopartciels
Nanopartciels comprising two different metallic elements offer additional degrees of freedom for altering their physical properties by varying the atomic composition and atomic arrangement. This could potentia...
