![Loading...](https://link.springer.com/static/c4a417b97a76cc2980e3c25e2271af3129e08bbe/images/pdf-preview/spacer.gif)
-
Chapter and Conference Paper
Texture analysis of silicide thin films: combining statistical and microscopical information
The statistical distribution of grain orientations in a poly-crystalline thin film, called texture, is an important characteristic. The presence of preferred orientations is important for the macroscopical beh...
-
Chapter and Conference Paper
Shift in electron energy loss compared for different nickel silicides in a Pt alloyed thin film
Nickel monosilicide (NiSi) is a promising material for electrical contacts and interconnects in the latest generation of CMOS devices [1]. Despite already being used in certain industrial applications, there i...
-
Chapter and Conference Paper
Imaging of compositional defects at silicide-silicon interfaces using aberration corrected HAADF
Silicide-silicon interfaces were studied at the superSTEM Laboratory using aberration corrected dedicated STEM at 100kV. With suitable samples the resolution of about 0.1 nm allows compositional defects of ato...
-
Chapter and Conference Paper
Structural and Compositional Properties of Strain-Symmetrized SiGe/Si Heterostructures
In this study, we have utilised conventional and aberration corrected (scanning) transmission electron microscopy to examine the Ge concentration across a series of technologically significant SiGe/Si prototyp...
-
Chapter and Conference Paper
(S)TEM/EELS characterisation of a multilayer C/Cr PVD coating
Carbon based coatings have attracted considerable interest in a wide range of industries due to their excellent tribological properties. Nanoscale hydrogen free C/Cr coatings have been produced by unbalanced m...