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    Chapter and Conference Paper

    Texture analysis of silicide thin films: combining statistical and microscopical information

    The statistical distribution of grain orientations in a poly-crystalline thin film, called texture, is an important characteristic. The presence of preferred orientations is important for the macroscopical beh...

    H. Schletter, S. Schulze, M. Hietschold in EMC 2008 14th European Microscopy Congress… (2008)

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    Chapter and Conference Paper

    Shift in electron energy loss compared for different nickel silicides in a Pt alloyed thin film

    Nickel monosilicide (NiSi) is a promising material for electrical contacts and interconnects in the latest generation of CMOS devices [1]. Despite already being used in certain industrial applications, there i...

    M. Falke, T. Schaarschmidt, H. Schletter in EMC 2008 14th European Microscopy Congress… (2008)

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    Chapter and Conference Paper

    Imaging of compositional defects at silicide-silicon interfaces using aberration corrected HAADF

    Silicide-silicon interfaces were studied at the superSTEM Laboratory using aberration corrected dedicated STEM at 100kV. With suitable samples the resolution of about 0.1 nm allows compositional defects of ato...

    M. Falke, U. Falke, P. Wang, A. Bleloch in EMC 2008 14th European Microscopy Congress… (2008)

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    Chapter and Conference Paper

    Structural and Compositional Properties of Strain-Symmetrized SiGe/Si Heterostructures

    In this study, we have utilised conventional and aberration corrected (scanning) transmission electron microscopy to examine the Ge concentration across a series of technologically significant SiGe/Si prototyp...

    I M Ross, M Gass, T Walther, A Bleloch in Microscopy of Semiconducting Materials 2007 (2008)

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    Chapter and Conference Paper

    (S)TEM/EELS characterisation of a multilayer C/Cr PVD coating

    Carbon based coatings have attracted considerable interest in a wide range of industries due to their excellent tribological properties. Nanoscale hydrogen free C/Cr coatings have been produced by unbalanced m...

    Z. Zhou, W. M. Rainforth, M. Gass in EMC 2008 14th European Microscopy Congress… (2008)