Abstract
Cr- and Sn-co-doped ZnO thin films were prepared via so-gel technique onto glass substrates. The produced films were characterized by XRD (X-ray diffraction), SEM (scanning electron microscopy), and ultraviolet-visible spectroscopy. The XRD indicated that the thin films grow with a preferred c-axis orientation. No traces of the Cr and Sn metals, oxides, or a ternary Zn-Cr-Sn phase were detected. This means that the addition of Cr and Sn into the ZnO matrix preserved the constitution of the wurtzite structure of ZnO. However, increasing the amount of Cr dopant in the ZnO thin films caused distortion, owing to the intercalation of the dopant atoms into the wurtzite structure. The optical band gap of the nanostructured zinc oxide thin films reduced from 3.25 to 2.28 eV with the increase in the content of Cr dopant from 5 to 20% mol. Moreover, with the same trend in Cr dopant increase, the water contact angles (WCA) altered from 69.0 to 38.8°. The photocatalytic degradation of methyl orange dye under visible irradiation was investigated for synthesized samples. The chromium-doped zinc oxide samples were improved: the photo degradation efficiency (91.5%) compared with the pure zinc oxide (41.5%).
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Mozammel, M., Ilkhechi, N.N., Tanouraghaj, E.F. et al. Evaluation of the effect of high concentration of dopant (Cr, Sn) on structural, optical, and wettability properties of ZnO thin films. J Aust Ceram Soc 55, 999–1007 (2019). https://doi.org/10.1007/s41779-019-00312-y
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DOI: https://doi.org/10.1007/s41779-019-00312-y