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  1. Article

    Open Access

    A randomized, double-blind, placebo-controlled phase III trial of duloxetine in Japanese fibromyalgia patients

    Fibromyalgia is characterized by widespread pain and is often accompanied by accessory symptoms. There are limited treatment options for this condition in Japan. Therefore, we conducted a phase III study to as...

    Masato Murakami, Kenichi Osada, Hiromichi Mizuno in Arthritis Research & Therapy (2015)

  2. No Access

    Chapter

    Dream Chip Project at ASET

    Chapter 9 introduces the results of Japanese national research and development (R&D) initiative of 3D integration technology using through-silicon via (TSV) over the 5-year period from 2008 to 2012. Associatio...

    Morihiro Kada, Harufumi Kobayashi in Three-Dimensional Integration of Semicondu… (2015)

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    Book

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    Chapter

    Fundamentals of SRAM Memory Cell

    This chapter introduces fundamentals of SRAM memory cell. The basic SRAM cell design and the operation are also described in this chapter. In Sect.2.1, the most common SRAM cell, the full CMOS 6-T memory cell,...

    Kenichi Osada in Low Power and Reliable SRAM Memory Cell and Array Design (2011)

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    Chapter

    Low Power Memory Cell Design Technique

    This chapter describes the low power memory cell design technique. Section 4.1 introduces fundamentals of leakage of SRAM array. In Sect. 4.2, source line voltage control techniques are explained as new design...

    Kenichi Osada, Masanao Yamaoka in Low Power and Reliable SRAM Memory Cell and Array Design (2011)

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    Chapter

    Low-Power Array Design Techniques

    This chapter introduces circuit technologies that enhance electric stability of the cell, the latest technologies that provide moderate timing generation, as well as larger cell stability. In Sect. 5.1, the vo...

    Koji Nii, Masanao Yamaoka, Kenichi Osada in Low Power and Reliable SRAM Memory Cell an… (2011)

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    Chapter

    Reliable Memory Cell Design for Environmental Radiation-Induced Failures in SRAM

    In this chapter, current status of environmental radiation-induced failures in SRAM is introduced. Alpha ray-induced soft-error has been a major concern for soft-errors in memories until late 1980s. Threat fro...

    Eishi Ibe, Kenichi Osada in Low Power and Reliable SRAM Memory Cell and Array Design (2011)

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    Chapter and Conference Paper

    Low-Voltage Embedded RAMs – Current Status and Future Trends

    Low-voltage high-density embedded (e-) RAMs, focusing on RAM cells and peripheral circuits, are described. First, challenges and trends in low-voltage e-RAMs are described based on the S/N issue of RAM cells, ...

    Kiyoo Itoh, Kenichi Osada, Takayuki Kawahara in Integrated Circuit and System Design. Powe… (2004)