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Article
Micro-raman study of the damage in nanopatterned GaAs(001)
A single-point diamond machine fabricated patterns with a series of equispaced lines in an area of nominally 10 µm × 10 µm. On a single GaAs wafer, patterns having 80, 100, 120, and 140 lines were machined. Sa...
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Article
Comparison of InGaSb/InAs superlattice structures grown by MBE on GaSb, GaAs, and compliant GaAs substrates
This paper contains the characterization results for indium arsenide/indium gallium antimonide (InAs/InGaSb) superlattices (SL) that were grown by molecular beam epitaxy (MBE) on standard gallium arsenide (GaA...
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Article
Comparison of GaAs grown on standard Si (511) and compliant SOI (511)
Gallium arsenide (GaAs) films were grown by molecular beam epitaxy (MBE) on a (511) silicon substrate and a compliant (511) silicon-on-insulator (SOI) substrate. The top silicon layer of the compliant (511) SO...
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Article
Real-Time Monitoring by Spectroscopic Ellipsometry and Desorption Mass Spectroscopy During Molecular Beam Epitaxy of AlGaAs/GaAs at High Substrate Temperatures
A series of AlGaAs/GaAs depositions were monitored in-situ by spectroscopic ellipsometry and desorption mass spectroscopy, under various substrate temperatures (890 K - 990 K) where non-unity sticking conditio...
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Article
A Kinetic Monte Carlo Model for Ga Desorption from Chemisorbed and Physisorbed States During High Temperature GaAs MBE
A kinetic Monte Carlo model is developed to examine the influence of As/Ga flux ratio on the Ga desorption kinetics during molecular beam epitaxy of (100)-GaAs, based on data reported in desorption mass spectr...
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Article
The use of computer controlled group V valved sources for interface type control in InGaSb/InAs strained layer superlattices
The purpose of this research is to demonstrate the necessity of computer controlled valved group V effusion cell sources in the growth of indium gallium antimonide/indium arsenide (InGaSb/InAs). These sources ...
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Article
Strain relief by surface undulations of dislocation free MBE grown antimonides on compliant universal GaAs substrates
Using solid source molecular beam epitaxy (MBE) of gallium antimonide (GaSb) and indium antimonide (InSb), we have demonstrated1 the ability to grow dislocation free lattice mismatched materials on gallium arseni...
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Article
A comparison of the critical thickness for MBE grown Lt-GaAs determined by In-Situ ellipsometry and transmission electron microscopy
The growth of low temperature (LT) GaAs by molecular beam epitaxy has been studied using ellipsometry. Different regimes of growth were observed in the data, depending on film thickness. Epitaxial growth of ps...
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Article
Modeling of MBE Growth with Interacting Fluxes
Ternary and quaternary III-V alloys are important for many optical device applications, and a precise control of the composition is required. Molecular beam epitaxy (MBE) is generally considered a non-equilibr...
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Article
Observation of low-T GaAs growth regimes by real-time ellipsometry
The molecular beam epitaxial growth of low temperature (LT) GaAs films has been studied by real-time ellipsometry. A modification in a GaAs (001) surface by cooling under a specific As2 flux caused a change in th...
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Article
Real-time, heuristic-based controlof molecular beam epitaxy
Real-time, heuristic-based control is appropriate for materials processes where accurate numerical models are not available. Frequently,bdthe scientists working with a process base their decisions when control...