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The Power and Limitation of Ion Beam Imaging in Focused Ion Beam Microscopes
In the past three decades, the focused ion beamFocused ion beam (FIB) microscope has evolved from a semiconductor production tool into an advanced...
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Highly 28Si enriched silicon by localised focused ion beam implantation
Solid-state spin qubits within silicon crystals at mK temperatures show great promise in the realisation of a fully scalable quantum computation...
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Understanding the impact of heavy ions and tailoring the optical properties of large-area monolayer WS2 using focused ion beam
Focused ion beam (FIB) is an effective tool for precise nanoscale fabrication. It has recently been employed to tailor defect engineering in...
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Rethinking radiation effects in materials science using the plasma-focused ion beam
AbstractThis work demonstrates the viability of using a plasma-focused ion beam (PFIB) as a new platform to carry out radiation effects studies in...
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Formation and Control of Hexagonal Pyramid Structures from GaN -Based Pillar-Shaped Structures Using Focused Ion-Beam Process
AbstractThe formation of controllable 3D structures on the surface of layered optoelectronic devices using GaN-based semiconductors is important for...
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Quantifying the Crack-Tip Residual Stress of Nickel-Based Single-Crystal Alloys at the Micron Scale by Focused Ion Beam and Digital Image Correlation
The cracking of nickel-based single-crystal alloys is associated with the residual stress. In this paper, we employed focused ion beam and digital...
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Ion Beam-Assisted Deposition
In this chapter, the ion beam-assisted deposition (IBAD) method is presented, which is characterized by the deposition of material in high vacuum and...
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High-quality YIG films preparation by metallo-organic decomposition and their use to fabricate spintronics nanostructures by focused ion beam
High-quality single-phase YIG films prepared by metallo-organic decomposition (MOD) and suitable for the fabrication of ordered nanostructures using...
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Ion Beam Figuring and Smoothing
The technologies, ion beam figuring (IBF) and ion beam-induced smoothing (IBS), are used to precisely remove imperfections or correct surface shape...
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Ion Beam-Induced Damages
Bombardment of surfaces with accelerated ions leads to the formation of defects, where lattice atoms can be displaced after collision with the...
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Focused Ion Beams and Complementary Techniques to Study the Silvering of Ancient Roman Coins
Abstract —Two ancient Roman silver coins dating back to the 3rd–4th century AD are studied. A set of modern micro- and nondestructive analytical...
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Detection of particles in the ion beam
In this study, we develop a new particle-monitoring system for a single-wafer implanter. The system is characterized by the (1) observation of...
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Spatially controlled epitaxial growth of 2D heterostructures via defect engineering using a focused He ion beam
The combination of two-dimensional (2D) materials into heterostructures enables the formation of atomically thin devices with designed properties. To...
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Features of the Formation of Ripple Structures on the Surface of Silicon under Irradiation with a Focused Gallium Ion Beam
Abstract —The processes of microrelief formation on the Si(100) surface under irradiation with a 30-keV Ga + -ion beam with doses of D = 6 × 10 16 –4 × 10
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Energy and Transport Lengths for Describing Volume of Resist Modification in Ion-Beam Lithography
AbstractOne of the ways to use a focused ion beam in lithographic processes to create nanostructures is through the exposure of special sensitive...
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Low-Energy Ion Beam Bombardment-Induced Nanostructures
An attractive ion beam method is the possibility of spontaneous formation of ordered surface patterns in the form of nanodots/nanoholes or sinusoidal...
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Possible modifications of parchment during ion beam analysis
Ion beam analysis (IBA) is an established method to determine the concentration and the distribution of elements in art and archaeological objects....
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Ion Beam Deposition and Cleaning
Direct deposition of low-energy ionized atoms or molecules (IBD) onto a substrate has key advantages in terms of controlling layer properties. In...
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Applicability of focused Ion beam (FIB) milling with gallium, neon, and xenon to the fracture toughness characterization of gold thin films
AbstractFocused ion beam (FIB) milling is an increasingly popular technique for fabricating micro-sized samples for nanomechanical characterization....
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Ion Beam Sputtering Induced Glancing Angle Deposition
The method of ion beam sputtering under glancing angle conditions in combination with an additional rotation of the sample holder allows the growth...