Page
%P
![Loading...](https://link.springer.com/static/c4a417b97a76cc2980e3c25e2271af3129e08bbe/images/pdf-preview/spacer.gif)
-
Article
In Situ SEM Observations of Electromigration Voids in Al Lines under Passivation
-
Article
Synchrotron Radiation for Measurement of Contaminants on Silicon Surfaces
The detection limit for aluminum using total reflection x-ray fluorescence (TXRF) is approximately 100 times lower for a synchrotron source compared to a conventional source. The detection limit for transition...
-
Article
High Resolution Observation of Void Motion in Passivated Metal Lines Under Electromigration Stress
Using a 120 kV STEM equipped with a backscattered electron detector and operated as a conventional SEM. voids in metal lines can be detected through 1 μm of passivation. By applying current to passivated thin met...