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Chapter and Conference Paper
Electron Microscopy Analysis of AlGaN/GaN Nanowires Grown by Catalyst-Assisted Molecular Beam Epitaxy
Scanning transmission electron microscopy has been used to investigate the composition of nickel seeds which promote the columnar growth of AlGaN / GaN nanowires deposited by molecular beam epitaxy (MBE) on sa...
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Chapter and Conference Paper
Structural and Compositional Properties of Strain-Symmetrized SiGe/Si Heterostructures
In this study, we have utilised conventional and aberration corrected (scanning) transmission electron microscopy to examine the Ge concentration across a series of technologically significant SiGe/Si prototyp...