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  1. No Access

    Chapter and Conference Paper

    Electron Microscopy Analysis of AlGaN/GaN Nanowires Grown by Catalyst-Assisted Molecular Beam Epitaxy

    Scanning transmission electron microscopy has been used to investigate the composition of nickel seeds which promote the columnar growth of AlGaN / GaN nanowires deposited by molecular beam epitaxy (MBE) on sa...

    L Lari, R T Murray, M Gass, T J Bullough… in Microscopy of Semiconducting Materials 2007 (2008)

  2. No Access

    Chapter and Conference Paper

    Structural and Compositional Properties of Strain-Symmetrized SiGe/Si Heterostructures

    In this study, we have utilised conventional and aberration corrected (scanning) transmission electron microscopy to examine the Ge concentration across a series of technologically significant SiGe/Si prototyp...

    I M Ross, M Gass, T Walther, A Bleloch… in Microscopy of Semiconducting Materials 2007 (2008)