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  1. No Access

    Article

    Comparison of III–V Heterostructures Grown on Ge/Si, Ge/SOI, and GaAs

    III–V/Ge/Si(001), III–V/Ge/SOI(001), and III–V/GaAs(001) heterostructures are fabricated and investigated. The Ge buffer layer for the III–V/Ge/Si structure is grown by vapor deposition onto a Si(001) substrat...

    A. A. Sushkov, D. A. Pavlov, A. I. Andrianov, V. G. Shengurov in Semiconductors (2022)

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    Article

    Demonstration of the Effect of Resistive Switching of Individual Filaments in Memristor Ag/Ge/Si Structures Using Atomic Force Microscopy

    The effect of resistive switching in individual dislocations in memristor Ag/Ge/Si(001) structures is demonstrated experimentally using atomic force microscopy with a conducting probe. A hysteresis is found in...

    V. A. Vorontsov, D. A. Antonov, A. V. Kruglov, I. N. Antonov in Technical Physics Letters (2021)

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    Article

    Effect of the AlGaAs Seed Layer Composition on Antiphase Domains Formation in (Al)GaAs Structures Grown by Vapor-Phase Epitaxy on Ge/Si(100) Substrates

    GaAs-based heterostructures grown by metalorganic vapor-phase epitaxy on virtual Ge/Si substrates using AlxGa1 – xAs seed layers with different aluminum contents x in solid solution have been investigated. The in...

    A. V. Rykov, R. N. Kryukov, I. V. Samartsev, P. A. Yunin in Technical Physics Letters (2021)

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    Article

    Resistive Switching in Memristors Based on Ge/Si(001) Epitaxial Layers

    The Ag/Ge/Si(001) stacks with threading dislocations growing through the Ge epitaxial layers (ELs) manifested bipolar resistive switching (RS) between two metastable resistance states. Scanning transmission el...

    D. O. Filatov, M. E. Shenina, V. G. Shengurov, S. A. Denisov in Semiconductors (2020)

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    Article

    Resistive Switching in Metal–Oxide–Semiconductor Structures with GeSi Nanoislands on a Silicon Substrate

    It is shown that self-forming GeSi nanoislands built into the dielectric–semiconductor interface in the Si(001)-based metal–oxide–semiconductor (MOS) structures with the SiOx and ZrO2(Y) dielectric layers obtaine...

    S. V. Tikhov, V. G. Shengurov, S. A. Denisov, I. N. Antonov in Technical Physics (2020)

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    Article

    On the Influence of Pulsed Gamma-Neutron Irradiation on the Morphology of Self-Assembled GeSi/Si(001) Nanoislands

    The influence of pulsed gamma-neutron irradiation on the surface morphology of GeSi/Si(001) heterostructures with surface self-assembled GeSi nanoislands grown by the combined sublimation molecular-beam epitax...

    M. M. Ivanova, D. O. Filatov in Journal of Surface Investigation: X-ray, S… (2020)

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    Article

    Resistive Switching in Memristors Based on Ag/Ge/Si Heterostructures

    Ag/Ge/Si heterostructures with threading dislocations in Ge layer can exhibit resistive switching (RS) in two regimes: (i) bipolar and (ii) volatile unipolar. In both regimes, these structures possess stable s...

    O. N. Gorshkov, V. G. Shengurov, S. A. Denisov, V. Yu. Chalkov in Technical Physics Letters (2020)

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    Article

    Studies of the Cross Section and Photoluminescence of a GaAs Layer Grown on a Si/Al2O3 Substrate

    A GaAs/AlAs/GaAs/AlAs/Ge heterostructure grown on a Si/Al2O3(1 \(\bar {1}\) ...02) substrate is form...

    A. A. Sushkov, D. A. Pavlov, V. G. Shengurov, S. A. Denisov in Semiconductors (2019)

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    Article

    Enhanced Photoluminescence of Heavily Doped n-Ge/Si(001) Layers

    The photoluminescence spectra of epitaxial n+-Ge:P/Si(001) structures are studied. The structures are grown by hot-wire chemical vapor deposition and doped with phosphorus to the maximum electron concentration 1 ...

    D. S. Prokhorov, V. G. Shengurov, S. A. Denisov, D. O. Filatov in Semiconductors (2019)

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    Article

    Tunnel Diodes Based on n+-Ge/p+-Si(001) Epitaxial Structures Grown by the Hot-Wire Chemical Vapor Deposition

    n+-Ge/p+-Si(001) epitaxial structures are grown by hot-wire chemical vapor deposition from GeH4 at a low substrate temperature (~325°C). Prototype tunnel diodes allowing for monolithic integration into Si-based i...

    V. G. Shengurov, D. O. Filatov, S. A. Denisov, V. Yu. Chalkov in Semiconductors (2019)

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    Article

    Effect of Pulsed Gamma-Neutron Irradiation on the Photosensitivity of Si-Based Photodiodes with GeSi Nanoislands and Ge Epitaxial Layers

    A comparative study of the effect of pulsed γ-neutron irradiation on the photosensitivity spectra of Si pn photodiodes with active layers based on self-assembled GeSi nanoisland arrays and Ge epitaxial layers is...

    M. M. Ivanova, A. N. Kachemtsev, A. N. Mikhaylov, D. O. Filatov in Semiconductors (2018)

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    Article

    Ballistic Hole Emission Spectroscopy of Self-Assembled GeSi/Si(001) Nanoislands

    Ballistic hole emission microscopy/spectroscopy has been applied to study the electronic structure of the hole states in the self-assembled GeSi/Si(001) nanoislands. The ballistic hole emission microscopic ima...

    D. O. Filatov, D. V. Guseinov, V. Yu. Chalkov, S. A. Denisov in Semiconductors (2018)

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    Article

    Investigation of spatial distribution of photocurrent in the plane of a Si p–n photodiode with GeSi nanoislands by scanning near-field optical microscopy

    The spatial distribution of photocurrent in the plane of a Si-based p +n junction with embedded self-assembled Ge x Si1–x ...

    D. O. Filatov, I. A. Kazantseva, V. G. Shengurov, V. Yu. Chalkov in Semiconductors (2017)

  14. No Access

    Article

    Stimulated emission in heterostructures with double InGaAs/GaAsSb/GaAs quantum wells, grown on GaAs and Ge/Si(001) substrates

    We report the observation of stimulated emission in heterostructures with double InGaAs/GaAsSb/GaAs quantum wells, grown on Si(001) substrates with the application of a relaxed Ge buffer layer. Stimulated emis...

    A. N. Yablonsky, S. V. Morozov, D. M. Gaponova, V. Ya. Aleshkin in Semiconductors (2016)

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    Article

    Conditions of growth of high-quality relaxed Si1–x Ge x layers with a high Ge content by the vapor-phase decomposition of monogermane on a sublimating Si hot wire

    The conditions of the epitaxial growth of high-quality relaxed Si1–x Ge x layers by the combined method of the sublimation molecular-beam epitaxy...

    V. G. Shengurov, V. Yu. Chalkov, S. A. Denisov, S. A. Matveev in Semiconductors (2016)

  16. No Access

    Article

    A silicon sublimation source for molecular-beam epitaxy

    A sublimation source for molecular-beam epitaxy of silicon layers with a rectangular wafer of doped Si is described. The wafer is attached to springing molybdenum clamps with a smaller width of the contact pad...

    V. G. Shengurov, S. A. Denisov, V. Yu. Chalkov in Instruments and Experimental Techniques (2016)

  17. No Access

    Article

    A random telegraph signal in tunneling silicon pn junctions with GeSi nanoislands

    We have experimentally discovered random telegraph signal generation in tunneling silicon p +n + junctions with embedded self-assembled GeSi nanois...

    D. O. Filatov, I. A. Kazantseva, V. G. Shengurov in Technical Physics Letters (2016)

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    Article

    Epitaxially Grown Monoisotopic Si, Ge, and Si1–x Ge x Alloy Layers: Production and Some Properties

    The technology of the growth of Si, Ge, and Si1–x Ge x layers by molecular-beam epitaxy with the use of a sublimation source of monoisotopic 30Si...

    A. P. Detochenko, S. A. Denisov, M. N. Drozdov, A. I. Mashin, V. A. Gavva in Semiconductors (2016)

  19. No Access

    Article

    A device for heating a substrate during molecular beam epitaxy

    A device for uniform heating of both optically opaque silicon and transparent sapphire large-area substrates (with a diameter of up to 100 mm) in vacuum to high temperatures of 1250–1450°C is described. Using ...

    V. G. Shengurov, S. A. Denisov, S. P. Svetlov in Instruments and Experimental Techniques (2016)

  20. No Access

    Article

    A device for growing silicon films on standard wafers using a sublimation source

    A device for depositing silicon films from a sublimation source on standard silicon wafers with diameters of 52−100 mm is described. The source is a silicon single crystal heated to a preset temperature of 130...

    S. A. Denisov, S. P. Svetlov, V. Yu. Chalkov in Instruments and Experimental Techniques (2015)

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