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  1. No Access

    Article

    Thin-film compound phase formation at Fe–Ge and Cr–Ge interfaces

    Phase formation was studied in the Fe–Ge and Cr–Ge thin-film systems by means of Rutherford backscattering spectrometry and x-ray diffraction. In the Fe–Ge system, FeGe was the first phase to form while in the...

    O. M. Ndwandwe, C. C. Theron, T. K. Marais, R. Pretorius in Journal of Materials Research (2003)

  2. No Access

    Article

    Prediction of First Phase Formation at Au-METAL Interfaces Using the Effective Heat of Formation Model

    The effective heat of formation model enables heats of formation to be calculated as a function of concentration. By choosing the effective concentration at the growth interface to be that of the liquidus mini...

    R. Pretorius, T. K. Marais, A. E. Muller, D. Knoesen in MRS Online Proceedings Library (1991)