31 Result(s)

Article

Silicide formation in contacts to Si nanowires

Silicides, intermetallic compounds formed by the reaction of a metal and Si, have long been used as contacts for metal oxide semiconductor (CMOS) transistors and have more become interesting for other Si nanow...

N. S. Dellas, C. J. Schuh, S. E. Mohney in Journal of Materials Science (2012)

Article

Improved Stability of Pd/Ti Contacts to p-Type SiC Under Continuous DC and Pulsed DC Current Stress

The enhanced stability of Pd/Ti contacts to p-type SiC under high-current-density continuous direct-current (DC) stressing is investigated and compared with previous work on Ti/Al contacts. Additionally, differin...

B. P. Downey, S. E. Mohney, J. R. Flemish in Journal of Electronic Materials (2011)

Article

The Influence of Contact Composition, Pretreatment, and Annealing Gas on the Ohmic Behavior of Ti/Al-Based Ohmic Contacts to n-Al _0.4Ga _0.6N

As the group III nitride semiconductor technology matures, an increasing number of devices are being fabricated with high Al fraction AlGaN. In this study, ohmic behavior is achieved using Ti/Al/Pt/Au contacts...

K. O. Schweitz, T. G. Pribicko, S. E. Mohney… in MRS Online Proceedings Library (2011)

Article

Engineering the Al-Ti/p-SiC Ohmic Contact for Improved Performance

The influence of composition on Al-Ti ohmic contacts to 4H p-SiC was studied. When NA was 7 x 10¹⁸ cm⁻³, contacts with 70 wt.% or more Al became ohmic when annealed at 1000°C for 2 min, whereas when there was 60 ...

J. Y. Lin, S. E. Mohney, M. Smalley, J. Crofton… in MRS Online Proceedings Library (2011)

Article

Current-Induced Degradation of Nickel Ohmic Contacts to SiC

The stability of Ni ohmic contacts to p-type SiC under high current density was investigated. A test structure adapted from the four circular contacts method allowed for vertical stressing and the ability to extr...

B.P. Downey, J.R. Flemish, B.Z. Liu, T.E. Clark… in Journal of Electronic Materials (2009)

Article

Ti/Al/Ti/Au and V/Al/V/Au Contacts to Plasma-Etched n-Al_0.58Ga_0.42N

Cross-sectional transmission electron microscopy was used to study annealed Ti/Al/Ti/Au and V/Al/V/Au ohmic contacts to as-received and plasma-etched n-Al_0.58Ga_0.42N. The reaction depth of low-resistance V-based ...

M.A. Miller, B.H. Koo, K.H.A. Bogart, S.E. Mohney in Journal of Electronic Materials (2008)

Article

Solid-state phase formation between Pd thin films and GaSb

Knowledge of the interaction between a thin metal film and a compound semiconductor can be used to engineer electrical contacts to the semiconductor. In this study, we examine the reaction between a 50 nm laye...

J. A. Robinson, S. E. Mohney in Journal of Electronic Materials (2006)

Article

Environmental sensitivity of Au diodes on n-AlGaN

With growing interest in AlGaN for ultraviolet detectors and high-power/high-temperature electronic devices, the problem of forming high-quality Schottky contacts to this semiconductor has become increasingly ...

E. D. Readinger, S. E. Mohney in Journal of Electronic Materials (2005)

Article

Foreword

C. R. Kao, S. -W. Chen, H. M. Lee, S. E. Mohney… in Journal of Electronic Materials (2004)

Article

Thermodynamic modeling of the Ni–Al–Ga–N system

Isothermal sections in the Ni–Al–Ga–N quaternary phase diagram were calculated to provide a greater understanding of interfacial reactions between Ni contacts and Al_xGa_1−xN. The calculations were performed employ...

B. A. Hull, S. E. Mohney, Z-K. Liu in Journal of Materials Research (2004)

Article

Vanadium-based ohmic contacts to n-type Al_0.6Ga_0.4N

Four vanadium-based contacts to n-type Al_0.6Ga_0.4N were compared in this work. Both V/Al/Pd/Au and V/Al/V/Au contacts with optimized layer thicknesses provided lower specific-contact resistances than did the prev...

J. H. Wang, S. E. Mohney, S. H. Wang, U. Chowdhury… in Journal of Electronic Materials (2004)

Article

Foreword

S. -W. Chen, H. M. Lee, D. Swenson, C. R. Kao… in Journal of Electronic Materials (2003)

Article

Intermetallic growth between lead-free solders and palladium

Intermetallic growth between Pd and the lead-free solders Sn-Ag and Sn-Ag-Cu has been studied. Diffusion couples were prepared by reflowing the solders on Pd and then aging the couples at 156°C, 175°C, 195°C, ...

Gaurav Sharma, C. M. Eichfeld, S. E. Mohney in Journal of Electronic Materials (2003)

Article

Condensed phase equilibria in transition metal-Ga-Sb systems and predictions for thermally stable contacts to GaSb

Antimonide-based compound semiconductors are promising candidates for high-frequency, low-power electronic devices as well as a variety of optoelectronic devices. To assist with the design of shallow or therma...

W. E. Liu, S. E. Mohney in Journal of Electronic Materials (2003)

Article

Phase equilibria in transition metal Al-Ga-N systems and thermal stability of contacts to AlGaN

As a first step in predicting the phase equilibria in TM-Al-Ga-N systems, where TM denotes a transition metal from the first three transition series, phase equilibria are calculated in the TM-Al-N systems, and...

K. O. Schweitz, S. E. Mohney in Journal of Electronic Materials (2001)

Article

Wet thermal oxidation of GaN

Thermal oxidation of GaN was conducted at 700–900°C with O₂, N₂, and Ar as carrier gases for 525–630 Torr of H₂O vapor. Upon oxidation of both GaN powders and n-GaN epilayers, the monoclinic β-Ga₂O₃ phase was ide...

E. D. Readinger, S. D. Wolter, D. L. Waltemyer… in Journal of Electronic Materials (1999)

Article

Refractory metal boride ohmic contacts to P-type 6H-SiC

Ohmic contacts have been fabricated on p-type 6H-SiC (1.3×10¹⁹ cm⁻³) using CrB₂, W₂B, and TiB₂. The boride layers (∼100–200 nm) were sputter-deposited in a system with a base pressure of 3×10⁻⁷ Torr. Specific con...

T. N. Oder, J. R. Williams, S. E. Mohney, J. Crofton in Journal of Electronic Materials (1998)

Article

Thermally Stable Schottky Contacts to n-GaN

The barrier heights of Ni/Ga/Ni and Re Schottky contacts to n-GaN were investigated by current-voltage (I-V) and capacitance-voltage (C-V) measurements. The elemental Ni contacts were also investigated for com...

H. S. Venugopalan, S. E. Mohney in MRS Online Proceedings Library (1998)