Page
%P
![Loading...](https://link.springer.com/static/c4a417b97a76cc2980e3c25e2271af3129e08bbe/images/pdf-preview/spacer.gif)
-
Article
Ceramic thin film thickness determination by nano-indentation
Abstracts are not published in this journal
-
Article
Theoretical approach to chemical vapour deposition in the atomic system Ti-Si-C-CI-H
-
Article
On the theoretical conditions of chemical deposition of refractory solid solutions: titanium carbonitride