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  1. No Access

    Article

    Advances in the Characterization of Compositionally-Graded Layers in Amorphous Semiconductor Solar Cells by Real Time Spectroellipsometry

    We have developed a real time spectroellipsometry data analysis procedure that allows us to characterize compositionally-graded amorphous semiconductor alloy thin films prepared by plasma-enhanced chemical vap...

    R. W. Collins, Sangbo Kim, Joohyun Koh, J. S. Burnham… in MRS Online Proceedings Library (1996)

  2. No Access

    Article

    Structural Evolution of Top-Junction a-Si:C:H:B and Mixed-Phase (Microcrystalline Si)-(a-Sil-xCx:H) p-Layers in a-Si:H n-i-p Solar Cells

    We have applied real time spectroellipsometry (RTSE) to study hydrogenated amorphous silicon (a-Si:H) solar cells fabricated in the Cr/n-i-p configuration using plasma-enhanced chemical vapor deposition (PECVD...

    Joohyun Koh, J. S. Burnham, Yeeheng Lit, Hongyue Liu… in MRS Online Proceedings Library (1996)

  3. No Access

    Article

    Real Time Monitoring of Amorphous Silicon Solar Cell Fabrication

    We have applied real time spectroscopie ellipsometry (RTSE) to monitor the successive growth of p-type a-Si1-xCx:H and i-type a-Si:H on specular SnO2:F (i.e., the superstrate solar cell configuration) in a single...

    Yiwei Lu, Sangbo Kim, J. S. Burnham, Ing-Shin Chen… in MRS Online Proceedings Library (1995)

  4. No Access

    Article

    Spectroellipsometry Studies of Zn1−xCdxSe: From Optical Functions to Heterostructure Characterization

    The dielectric functions of 0.5-1.5 µm Zn1−xCdxSe (0≤x≤0.34) epilayers on GaAs have been determined over the photon energy range 1.5≤E≤5.3 eV. These spectra have been parameterized using the Sellmeier approximati...

    Joungchel Lee, Byungyou Hong, J.S. Burnham, R.W. Collins… in MRS Online Proceedings Library (1995)