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  1. No Access

    Chapter

    Hot Carrier Thermalization Dynamics in Low-Temperature-Grown III-V Semiconductors

    The presence of point defects is expected to influence the properties of free carriers in semiconductors. Low-temperature-grown (LT) GaAs is a material with a high density of point defects and a unique combina...

    A. I. Lobad, Y. Kostoulas, G. W. Wicks, P. M. Fauchet in Hot Carriers in Semiconductors (1996)

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    Article

    The Ultrafast Carrier Dynamics in Semiconductors: The Role of Defects

    The presence of point defects is expected to influence the properties of free carrier in semiconductors. We have used the techniques of ultrafast laser spectroscopy to characterize the dynamics of photoinjecte...

    P. M. Fauchet, G. W. Wicks, Y. Kostoulas, A. I. Lobad… in MRS Online Proceedings Library (1995)