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  1. Article

    Open Access

    Direct imaging, three-dimensional interaction spectroscopy, and friction anisotropy of atomic-scale ripples on MoS2

    Theory predicts that two-dimensional (2D) materials may only exist in the presence of out-of-plane deformations on atomic length scales, frequently referred to as ripples. While such ripples can be detected vi...

    Omur E. Dagdeviren, Ogulcan Acikgoz, Peter Grütter… in npj 2D Materials and Applications (2020)

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  2. No Access

    Chapter

    Dissipation Modulated Kelvin Probe Force Microscopy Method

    We review a new experimental implementation of Kelvin probe force microscopy (KPFM) in which the dissipation signal of frequency modulation atomic force microscopy (FM-AFM) is used for dc bias voltage feedback...

    Yoichi Miyahara, Peter Grütter in Kelvin Probe Force Microscopy (2018)

  3. Article

    Open Access

    Characterization of a gold coated cantilever surface for biosensing applications

    Cantilever based sensors are a promising tool for a very diverse spectrum of biological sensors. They have been used for the detection of proteins, DNA, antigens, bacteria viruses and many other biologically r...

    Ann-Lauriene Haag, Yoshihiko Nagai, R Bruce Lennox… in EPJ Techniques and Instrumentation (2015)

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  4. No Access

    Chapter

    Field Ion Microscopy for the Characterization of Scanning Probes

    Scanning probe microscopy (SPM) is a widely used tool for investigating the nanoscale structure of materials, as well as their electronic and mechanical properties with its related spectroscopic modes of opera...

    William Paul, Peter Grütter in Surface Science Tools for Nanomaterials Characterization (2015)

  5. Article

    Open Access

    EPJ Techniques and Instrumention

    Stephen Buckman, Peter Grütter, Martin Hegner in EPJ Techniques and Instrumentation (2014)

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  6. No Access

    Chapter

    Electrostatic Force Microscopy Characterization of Low Dimensional Systems

    The electrostatic potential profile is of great importance in nanoscale electronic devices. The effect of the random potential caused by dopants or other defects becomes an increasingly more important problem ...

    Yoichi Miyahara, Lynda Cockins, Peter Grütter in Kelvin Probe Force Microscopy (2012)

  7. No Access

    Article

    Plasticity, healing and shakedown in sharp-asperity nanoindentation

    Spatially localized stress fields produced by instrumented, sharp indentation probes are a route to testing the mechanical properties of materials at the smallest length scales. Here we provide direct experime...

    Graham L. W. Cross, André Schirmeisen, Peter Grütter, Urs T. Dürig in Nature Materials (2006)

  8. No Access

    Article

    Imaging, Manipulation, and Spectroscopic Measurements of Nanomagnets by Magnetic Force Microscopy

    Magnetic force microscopy (MFM) is a well-established technique for imaging the magnetic structures of small magnetic particles. In cooperation with external magnetic fields, MFM can be used to study the magne...

    **aobin Zhu, Peter Grütter in MRS Bulletin (2004)