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  1. No Access

    Article

    Thermoelectric Properties and Chemical Potential Tuning by K- and Se-Coalloying in (Pb0.5Sn0.5)1−xKxTe0.95Se0.05

    Topological crystal insulator (TCI) and topological Dirac semimetals have topologically nontrivial surface and bulk state, respectively. The parent compound of Pb0.5Sn0.5Te exhibiting TCI band inversion has parti...

    Dianta Ginting, Chan-Chieh Lin, Gareoung Kim, Song Yi Back… in Electronic Materials Letters (2019)

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    Article

    Growth of High-Quality Pb(ZrxTi1-x)O3 Films by Peroxide MBE and Their Optical and Structural Characteristics

    The growth of Pb(ZrxTi1-x)O3 (PZT) films by molecular beam epitaxy was demonstrated. Single-crystal, single-phase PZT films were grown on (001) SrTiO3 substrates at a growth temperature of 600°C. In situ monitori...

    Natalia Izyumskaya, Vitaliy Avrutin, **ng Gu, Umit Ozgur… in MRS Online Proceedings Library (2007)

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    Article

    Structural and Optical Properties of PbTiO3 Grown on SrTiO3 Substrates by Peroxide MBE

    Lead titanate (PbTiO3), a ferroelectric material with perovskite structure, has received a great deal of attention owing to a unique combination of its piezoelectric, pyroelectric, dielectric, electo- and acousto...

    Natalia Izyumskaya, Vitaliy Avrutin, **ng Gu, Umit Ozgur… in MRS Online Proceedings Library (2007)

  4. No Access

    Article

    Optical Study of SiO2/nanocrystalline-Si Multilayers Using Ellipsometry

    Using variable-angle spectroscopic ellipsometry, we measure the pseudo-dielectric functions of as-deposited and annealed SiO2/SiOx multilayers (MLs). The SiO2(2nm)/SiOx(2nm) MLs have been prepared under various d...

    Kang-Joo Lee, Tae-Dong Kang, Hosun Lee, Seung Hui Hong… in MRS Online Proceedings Library (2004)

  5. No Access

    Article

    Dielectric Function and Band Gaps of Si1−xCx AND Si0.924−xGe0.076Cx (0≤x≤0.014) Semiconductor Alloys Grown on Si

    We have characterized the optical properties of heteroepitexial Si1−xCx and Si0.924−xGe0.076Cx (0≤x≤0.014) alloys grown on Si substrates by solid phase epitaxy using spectroscopic ellipsometry. The measured diele...

    Hosun Lee, J. A. Floro, J. Strane, S. R. Lee, E. D. Jones… in MRS Online Proceedings Library (1995)