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  1. No Access

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    Resonant Raman scattering of ZnS, ZnO, and ZnS/ZnO core/shell quantum dots

    Resonant Raman scattering by optical phonon modes as well as their overtones was investigated in ZnS and ZnO quantum dots grown by the Langmuir–Blodgett technique. The in situ formation of ZnS/ZnO core/shell q...

    A. G. Milekhin, N. A. Yeryukov, L. L. Sveshnikova, T. A. Duda… in Applied Physics A (2012)

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    Article

    Influence of near-surface and volume real structure on the electronic properties of SrTiO3 MIM structures

    Perovskite-type transition metal oxides have great potential as storage material in resistive random-access memory (RRAM) devices. Typical non-volatile memory cells are realized in metal-insulator-metal (MIM) ...

    J. Seibt, F. Hanzig, R. Strohmeyer, H. Stoecker… in MRS Online Proceedings Library (2011)

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    Growth peculiarities during vapor–liquid–solid growth of silicon nanowhiskers by electron-beam evaporation

    One-dimensional (1D) silicon (Si) nanostructures were grown by electron-beam evaporation catalyzed by gold nanoparticles on silicon substrates following the vapor–liquid–solid growth mechanism. We report three...

    V. Sivakov, G. Andrä, C. Himcinschi, U. Gösele, D.R.T. Zahn… in Applied Physics A (2006)

  4. No Access

    Article

    Infrared spectroscopy of bonded silicon wafers

    Infrared spectra of multiple frustrated total internal reflection and transmission for silicon wafers obtained by direct bonding in a wide temperature range (200–1100°C) are studied. Properties of the silicon ...

    A. G. Milekhin, C. Himcinschi, M. Friedrich, K. Hiller, M. Wiemer… in Semiconductors (2006)

  5. No Access

    Article

    Spectroscopic ellipsometric characterization of organic films obtained via organic vapor phase deposition

    Thin films of Tris(8-hydroxyquinoline)-aluminum(III) (Alq3) and N,N′-Di-[(1-naphthyl)-N,N′-diphenyl]-(1,1′-biphenyl)-4,4′-diamine (α-NPD ) were deposited on large-area silicon substrates by means of the recently ...

    C. Himcinschi, N. Meyer, S. Hartmann, M. Gersdorff, M. Friedrich… in Applied Physics A (2005)

  6. No Access

    Article

    Ellipsometric study of the change in the porosity of silica xerogels after chemical modification of the surface with hexamethyldisilazane

    Variable angle spectroscopic ellipsometry (VASE) and ellipsometric porosimetry (EP) have been used to study the effect of treatment with hexamethyldisilazane (HMDS) on the porosity of silica xerogel films. Ch...

    C. Himcinschi, M. Friedrich, S. Frühauf… in Analytical and Bioanalytical Chemistry (2002)