Skip to main content

3 Result(s)

within Article Remove this filter Klaus Köhler Remove this filter Characterization and Evaluation of Materials Remove this filter

and

  1. Article

    Implantation Studies on Silicon-Doped GaN

    Silicon-doped GaN layers grown by low-pressure metalorganic vapor-phase epitaxy with Si concentrations ranging from 2 × 1017 Si/cm3 to 9.2 × 1018 Si/cm3 were investigated by means of the perturbed angular correla...

    Ronnie Simon, Reiner Vianden, Klaus Köhler in Journal of Electronic Materials (2013)

    Download PDF (417 KB)

  2. No Access

    Article

    Abatement of NO Using Rhodium Catalysts Supported on Carbon Nanotubes: Carbon as Support Material and Reducing Agent

    The catalytic abatement of NO over rhodium catalysts supported on carbon nanotubes was studied. In the absence of oxygen, Rh/carbon nanotubes (CNT) catalysts exhibit high activities in the catalytic reduction ...

    Hans Beyer, Konstantinos Chatziapostolou, Klaus Köhler in Topics in Catalysis (2009)

  3. No Access

    Article

    SIMS depth profiling of Mg back-diffusion in (AlGaIn)N light-emitting diodes

    The Mg do** profiles in close proximity to the (AlGaIn)N/GaN QW active region of group III-nitride light-emitting diodes grown by low pressure metal-organic vapor-phase epitaxy on sapphire substrates were in...

    Lutz Kirste, Klaus Köhler, Manfred Maier… in Journal of Materials Science: Materials in… (2008)