Abstract
Thin (AsSe)100–xAgx (x = 0–25 mol.%) films have been deposited on glass substrates and silicon cantilevers by vacuum thermal evaporation from the corresponding bulk materials. The mechanical stability was investigated by measuring the stress of the films deposited on silicon cantilevers. The correlation between the stress and the composition has been investigated and will be discussed.
In order to investigate photoinduced changes in the refractive index, the films have been exposed to a He-Ne laser. The transmission spectra of the films have been measured before and after laser illumination; the refractive index has been derived by Swanepoel method. The photoinduced changes occurring in the films after illumination lead to changes of the optical constants. These features make the investigated materials suitable for application in planar chalcogenide-based sensor devices.
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Ilcheva, V. et al. (2015). Stress Measurements and Optical Studies of (AsSe)100−xAgx Films for Optical Sensor Applications. In: Petkov, P., Tsiulyanu, D., Kulisch, W., Popov, C. (eds) Nanoscience Advances in CBRN Agents Detection, Information and Energy Security. NATO Science for Peace and Security Series A: Chemistry and Biology. Springer, Dordrecht. https://doi.org/10.1007/978-94-017-9697-2_31
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DOI: https://doi.org/10.1007/978-94-017-9697-2_31
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