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    Article

    Mechanism of metal nanowire formation via the polyol process

    The morphology and cap** layer of Ag-nanowires prepared using the polyol process were examined to understand their formation mechanism. Cu-nanowires prepared from the salt reduction process were examined as ...

    Yo-Han Choi, Young-Soo Chae, Jong-Hyuk Lee, Yong-woo Kwon in Electronic Materials Letters (2015)

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    Article

    Influence of pad shape on self-alignment in electronic packaging

    Anisotropic self-alignment of the noncircular pads is investigated to reduce the misalignment in electronic packaging, and the effects of the direction and length ratio of the noncircular pads are analyzed. Th...

    Do H. Ahn, Jihye Lee, Choong D. Yoo, Yong-Seog Kim in Journal of Electronic Materials (2006)

  3. No Access

    Article

    Reaction characteristics of the In-15Pb-5Ag solder with a Au/Ni/Cu pad and their effects on mechanical properties

    Reaction characteristics of the In-15Pb-5Ag (wt.%) solder with a Au/Ni/Cu pad during reflow soldering and aging treatment were examined. Interfacial reaction during reflow resulted in either an AuIn2 or Ni28In72 ...

    Jong-Hyun Lee, Yong-Seong Eom, Kwang-Seong Choi in Journal of Electronic Materials (2004)

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    Article

    Kinetics of the Au-Ni-Sn ternary intermetallic layer redeposition at the solder/under-bump metallurgy interface during aging treatment

    The Au-Ni-Sn ternary intermetallic layer redeposition at the interface between the solder and the Au/Ni/Cu under-bump metallurgy (UBM) was measured experimentally and analyzed theoretically. The predicted thic...

    Jong-Hyun Lee, Jong-Whan Park, Dong Hyuk Shin in Journal of Electronic Materials (2004)

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    Article

    Reaction characteristics of the Au-Sn solder with under-bump metallurgy layers in optoelectronic packages

    The reaction characteristics of molten Au/Sn eutectic solder with potential diffusion-barrier materials of optoelectronic packages were investigated. The characteristics were studied by reflowing the solder on...

    Jong-Hwan Park, Jong-Hyun Lee, Yong-Ho Lee in Journal of Electronic Materials (2002)

  6. No Access

    Article

    Kinetics of intermetallic formation at Sn-37Pb/Cu interface during reflow soldering

    The kinetics of the intermetallic layer formation at Sn-37wt.%Pb solder/Cu pad interface during reflow soldering were studied. The growth kinetics were analyzed theoretically by assuming that the mass flux of ...

    Jong-Hyun Lee, Yong-Seog Kim in Journal of Electronic Materials (2002)

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    Article

    Laser soldering for chip-on-glass mounting in flat panel display application

    Chip-on-glass (COG) mounting of area array electronic packages was attempted by heating the rear surfrace of a contact pad film deposited on a glass substrate. The pads consisted of an adhesion (i.e., Cr or Ti...

    Jong-Hyun Lee, Won-Yong Kim, Dong-Hoon Ahn, Yong-Ho Lee in Journal of Electronic Materials (2001)

  8. No Access

    Article

    Kinetics of Au-containing ternary intermetallic redeposition at solder/UBM interface

    In this study, the effects of the under bump metallurgy (UBM) structure and Cu content in solders on the redeposition rate of Au-containing ternary intermetallics at the solder/UBM interface were investigated....

    Jong-Hyun Lee, Jong-Hwan Park, Dong-Hyuk Shin in Journal of Electronic Materials (2001)

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    Article

    Reliability of composite solder bumps produced by an in-situ process

    In an attempt to develop a thermally stable solder system, an in-situ Pb-Sn solder composite reinforced with Cu6Sn5 dispersoids was investigated for its thermal stability. The stability was evaluated mainly by me...

    Jong-Hyun Lee, Dae** Park, Jong-Tae Moon, Yong-Ho Lee in Journal of Electronic Materials (2000)

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    Article

    Characteristics of the Sn-Pb eutectic solder bump formed via fluxless laser reflow soldering

    In an attempt to develop a fluxless reflow solder bum** process, the effects of processing variables, which include energy input rate and time, and the shape of solder disk on the microstructure of the solde...

    Jong-Hyun Lee, Dae** Park, Jong-Tae Moon, Yong-Ho Lee in Journal of Electronic Materials (2000)