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  1. No Access

    Article

    Galvanic corrosion effects in InP-based laser ridge structures

    Galvanic corrosion effects in metallized III-V laser structures have been studied. Small gaps present in the metallization can leave exposed semiconductor regions, which are susceptible to localized corrosion ...

    D. G. Ivey, J. Luo, S. Ingrey, R. Moore, I. Woods in Journal of Electronic Materials (1998)

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    Article

    Surface charge spectroscopy—A novel surface science technique for measuring surface state distributions on semiconductors

    A novel technique, surface charge spectroscopy (SCS), has been developed for measuring interface state density at a dielectric-semiconductor interface in conjunction with x-ray photoelectron spectroscopy (XPS)...

    R. W. M. Kwok, W. M. Lau, D. Landheer, S. Ingrey in Journal of Electronic Materials (1993)

  3. No Access

    Article

    High Resolution Auger Depth Profiles using a Dual Ion Gun System

    A dual ion gun system has been proposed (D.E. Sykes et al, Appl. Surf. Sci. 5 (1980) 103) to reduce texturing and improve depth resolution during Auger sputter depth profiling. We have evaluated this ion gun c...

    S. Ingrey, J. P. D. Cook in MRS Online Proceedings Library (1985)