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    Article

    Rapid epitaxial growth of conducting and insulating III-V compounds on (001), (110), (111)A, (311)A, and (311)B surfaces by hydride vapor phase epitaxy

    Rapid growth of conducting or insulating InP, GaAs, Ga0.47In0.53As, and GaAs0.6P0.4 on one or more of substrates of orientations (001), (110), (111)A, (311)A, and (311)B by hydride vapor phase epitaxy (HVPE) is d...

    S. Lourdudoss, N. Gopalakrishnan, R. Holz in Metallurgical and Materials Transactions A (1999)

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    Chapter and Conference Paper

    High-Speed Helicopter Rotor Noise-Shock Waves as a Potent Source of Sound

    In this paper we discuss the problem of high speed rotor noise prediction. In particular, we propose that from the point of view of the acoustic analogy, shocks around rotating blades are sources of sound. We ...

    F. Farassat, Yung-Jang Lee, H. Tadghighi in Unsteady Aerodynamics, Aeroacoustics, and … (1993)

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    Chapter and Conference Paper

    A Laboratory X-Ray Microscope with a Plasma X-Ray Source

    A laboratory x-ray microscope has been built with zone plate optics and a pulsed plasma x-ray source. X-ray images of metal patterns, diatoms and 3T3 mouse cells have been taken with sub-optical resolution at ...

    G. Schmahl, B. Niemann, D. Rudolph, M. Diehl, J. Thieme, W. Neff in X-Ray Microscopy III (1992)

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    Chapter and Conference Paper

    A Plasma Source for an Imaging X-Ray Microscope

    Pinch plasmas are sources of high brilliance for soft x-rays in the wavelength range from λ = 0.1 nm to 20 nm. A plasma focus device emitting line radiation of hydrogen-like nitrogen (N VII) at λ = 2.5 nm into...

    R. Lebert, R. Holz, D. Rothweiler, F. Richter, W. Neff in X-Ray Microscopy III (1992)

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    Chapter and Conference Paper

    A Plasma Focus as Radiation Source for a Laboratory X-Ray Microscope

    To open the X-ray microscopy to a wider range of applications there is need for a user oriented tool for routine biological investigations, which is located in the laboratories of biologists. The requirements ...

    W. Neff, J. Eberle, R. Holz, F. Richter, R. Lebert in X-Ray Microscopy II (1988)