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  1. No Access

    Article

    Spectroscopic studies of O-vacancy defects in transition metal oxides

    Dielectrics comprised of nano-crystalline HfO2 in gate stacks with thin SiO2/SiON interfacial transition regions display significant asymmetries with respect to trap** of Si substrate injected holes and electro...

    G. Lucovsky, J. Lüning, L. B. Fleming… in Journal of Materials Science: Materials in… (2007)

  2. No Access

    Article

    Effects of Structural Properties of Hf-Based Gate Stack on Transistor Performance

    Electron traps in ALD and MOCVD HfO2 and HfSiO high-k dielectrics were investigated using both conventional DC and pulse measurements. It was found that the traps in the gate stack could be associated with defect...

    G. Bersuker, J.H. Sim, C.D. Young, R. Choi, B. H. Lee… in MRS Online Proceedings Library (2003)

  3. No Access

    Article

    Experimental Study of Etched Back Thermal Oxide for Optimization of the Si/High-k Interface

    We have demonstrated a uniform, robust interface for high-k deposition with significant improvements in device electrical performance compared to conventional surface preparation techniques. The interface was ...

    Joel Barnett, N. Moumen, J. Gutt, M. Gardner, C. Huffman… in MRS Online Proceedings Library (2003)

  4. No Access

    Article

    Process and Manufacturing Challenges for High-K Gate Stack Systems

    A design-of-experiments methodology was implemented to assess the commercial equipment viability to fabricate the high-K dielectrics Ta2O5, TiO2 and BST (70/30 and 50/50 compositions) for use as gate dielectrics....

    M. C. Gilmer, T. Y. Luo, H. R. Huff, M. D. Jackson… in MRS Online Proceedings Library (1999)

  5. No Access

    Chapter and Conference Paper

    Design experience with fine-grained FPGAs

    The performance of fine-grained, cellular FPGAs is improving rapidly. In this paper, the experience of working with two relatively fine-grained FPGA architectures, the Atmel 6005 FPGA and the Dynamically Progr...

    P. Lysaght, D. McConnell, H. Dick in Field-Programmable Logic Architectures, Sy… (1994)

  6. No Access

    Chapter and Conference Paper

    Artificial neural network implementation on a fine-grained FPGA

    This paper reports on the implementation of an Artificial Neural Network (ANN) on an Atmel AT6005 Field Programmable Gate Array (FPGA). The work was carried out as an experiment in map** a bit-level, logical...

    P. Lysaght, J. Stockwood, J. Law, D. Girma in Field-Programmable Logic Architectures, Sy… (1994)