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  1. Article

    Open Access

    Reduction of charge offset drift using plasma oxidized aluminum in SETs

    Aluminum oxide ( \({\text {AlO}}_x\) AlO x ...

    Yanxue Hong, Ryan Stein, M. D. Stewart Jr., Neil M. Zimmerman in Scientific Reports (2020)

  2. Article

    Open Access

    Long-term drift of Si-MOS quantum dots with intentional donor implants

    Charge noise can be detrimental to the operation of quantum dot (QD) based semiconductor qubits. We study the low-frequency charge noise by charge offset drift measurements for Si-MOS devices with intentionall...

    M. Rudolph, B. Sarabi, R. Murray, M. S. Carroll, Neil M. Zimmerman in Scientific Reports (2019)

  3. Article

    Open Access

    Machine learning techniques for state recognition and auto-tuning in quantum dots

    Recent progress in building large-scale quantum devices for exploring quantum computing and simulation has relied upon effective tools for achieving and maintaining good experimental parameters, i.e., tuning u...

    Sandesh S. Kalantre, Justyna P. Zwolak, Stephen Ragole in npj Quantum Information (2019)

  4. Article

    Open Access

    Spin decoherence in a two-qubit CPHASE gate: the critical role of tunneling noise

    Rapid progress in semiconductor spin qubits has enabled experimental demonstrations of a two-qubit logic gate. Understanding spin decoherence in a two-qubit logic gate is necessary for optimal qubit operation....

    Peihao Huang, Neil M. Zimmerman, Garnett W. Bryant in npj Quantum Information (2018)

  5. No Access

    Article

    Frequency Dependence of a Cryogenic Capacitor Measured Using Single Electron Tunneling Devices

    A new type of capacitance standard based on counting electronshas been built. The operation of the standard has alreadygiven very promising results for the determination of thevalue of a cryogenic vacuum-gap c...

    Ali L. Eichenberger, Mark W. Keller, John M. Martinis in Journal of Low Temperature Physics (2000)

  6. No Access

    Article

    Sub-Micron Mesotaxial CoSi2 Wires

    Transition metal suicides are receiving an increasing amount of attention as materials for VLSI interconnects because of their low resistivities and ease of integration with silicon. A recently invented techni...

    J. Alex Liddle, Neil M. Zimmerman, Alice E. White in MRS Online Proceedings Library (1992)