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Article
Nanometer scale crystallographic texture map** of platinum and lead zirconate titanate thin films by electron backscatter diffraction
Automated high resolution electron backscatter diffraction was used to map the local crystallographic texture of Pt and PbZr1−x Ti x O3 (PZT) thin films w...
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Article
Effect of crystallographic orientation on phase transformations during indentation of silicon
In a statistical nanoindentation study using a spherical probe, the effect of crystallographic orientation on the phase transformation of silicon (Si) was investigated. The occurrence and the contact pressures...
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Article
Equi-Axed Grain Formation in Electrodeposited Sn-Bi
Sn is widely used as a coating in the electronics industry because it provides excellent solderability, ductility, electrical conductivity, and corrosion resistance. However, Sn whiskers have been observed to ...
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Article
High Degree of Crystalline Perfection in Spontaneously Grown GaN Nanowires
We have grown a variety of isolated GaN nanowires using gas-source molecular beam epitaxy (MBE) and characterized their structural and optical properties. The nanowires have demonstrated a number of promising ...
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Article
Electron backscattered diffraction and energy dispersive X-ray spectroscopy study of the phase NiSn4
Electron backscattered diffraction (EBSD) and energy dispersive X-ray spectroscopy (EDS) have been performed on a plate-shaped phase formed through the reaction of Sn and Ni. The phase is formed during extende...
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Article
Partial melt processing of solid-solution Bi2Sr2CaCu2O8+δ thick-film conductors with nanophase Al2O3 additions
Partial-melt processing of Bi2+xSr2-x-yCa1+yCu2O8+δ (Bi-2212) thick-film conductors with additions of nanophase Al2O3 was studied for dual purposes of increasing flux pinning and inhibiting Sr—Ca—Cu—O phase defec...
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Article
The Stress State and Domain Structure of Epitaxial PbZr0.2Ti0.8O3 Films on (001) SrTiO3 with and without La0.5Sr0.5CoO3 Electrode Layer
The domain structure of the 400 nm thick PbZr0.2Ti0.8O3 (PZT) films with different electrode layer configurations was investigated by x-ray diffraction and transmission electron microscopy. Thec-domain fractions ...
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Article
Silicon Microhotplate Arrays as a Platform for Efficient Gas Sensing Thin Film Research
Applications for quantitative detection of gas concentrations exist in areas as diverse as manufacturing processing, environmental monitoring, and medical diagnostics, and require devices that are fast, robust...
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Article
Electromagnetic and microstructural investigations of a naturally grown 8° [001] tilt bicrystal of Bi2Sr2CaCu208 + x
Electromagnetic characterization and high resolution transmission electron microscopy have been conducted on the same 8° [001] symmetrical (010) tilt boundary in a naturally grown, bulk-scale bicrystal of Bi2Sr2C...
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Article
Experimental assessment of crack-tip dislocation emission models for an Al67Cr8Ti25 intermetallic alloy
A potential explanation for the cleavage fracture of intermetallic alloys with low or moderate critical resolved shear stress (CRSS) is the existence of an energy barrier for crack-tip dislocation emission, as...
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Article
Growth of Epitaxial BaTiO3 Thin Films at 600°C by Metalorganic Chemical Vapor Deposition
Metalorganic chemical vapor deposition (MOCVD) was used to deposit epitaxial BaTiO3 thin films on (100) MgO substrates at 600°C. The metalorganic precursors employed in the deposition experiments were hydrated Ba...
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Article
Characterization of Lead Zirconate-Titanate Thin Films Prepared by Pulsed Laser Deposition
Dense smooth lead zirconate-titanate thin films have been prepared by excimer laser deposition. The as-deposited films are amorphous as indicated by x-ray powder patterns. Differential scanning calorimetry stu...
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Article
Texturing and Dielectric Properties of Laser Deposited BaTiO3 Thin Films Grown on Heated Substrates
Thin films of BaTiO3 were deposited on platinum-coated silicon substrates using pulsed laser deposition and characterized using electron microscopy, powder x-ray diffraction and electrical measurements. The micro...
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Article
Crystallographic Aspects of Ferroelectric Pzt Thin Films Prepared by Laser Deposition Technique
X-ray diffraction techniques were used to study the crystallography of PZT thin films prepared by the laser deposition technique. This investigation included identification of phases formed during the annealin...
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Article
Microstructural Changes During Processing of Laser-Deposited BaTiO3 and Pzt Thin Films
Thin films of BaTiO3 and PZT (lead zirconate titanate, 47%PbTiO3, 53%PbZrO3) have been produced by laser irradiation of the appropriate ceramic targets and deposition of the ejected and vaporized material on plan...
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Article
Grain Boundary Characterization in Ni3Al
Grain boundaries in both pure and boron doped Ni3A1 have been studied using a variety of electron microscopy techniques. Small angle boundary structures were examined in both bicrystal and polycrystalline specime...
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Article
Diffraction Studies of the Atomic Structure of Grain Boundaries
The application of diffraction techniques to study the atomic structure of grain boundaries is reviewed. The determination of the projected structure of a large angle [001] twist boundary is described. The inf...
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Article
Analysis of the Structure of Grain Boundaries Normal to the Boundary Plane Using Diffraction Techniques
By recording the intensity of electron scattering along the reciprocal lattice direction normal to the interface plane of a grain boundary, diffraction data is obtained which is sensitive to the boundary struc...
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Article
Direct comparison of the loss of load transfer to “E” and “S” glass fibres manufactured by drawing into different environments
Accelerated water uptake tests have been used to compare the onsets of destruction of the ability to transfer shear stress at fibre/matrix interfaces in epoxy matrix glass reinforced plastic (GRP) manufactured...
