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Article
Different sensing mechanisms in single wire and mat carbon nanotubes chemical sensors
Chemical sensing properties of single wire and mat form sensor structures fabricated from the same carbon nanotubes (CNT) materials have been compared. Sensing properties of CNT sensors were evaluated upon ele...
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Article
Time and energy dependent dynamics of the STM tip — graphene system
Probability current and probability density of wave packets was calculated by solving the three dimensional time-dependent Schrödinger equation for a local potential model of the scanning tunneling microscope...
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Article
Open AccessIon irradiation effects on conduction in single-wall carbon nanotube networks
We have measured how irradiation by Ar+ and N+ ions modifies electronic conduction in single-wall carbon nanotube (SWNT) networks, finding dramatically different effects for different thicknesses. For very thin t...
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Chapter
Modeling and Interpretation of STM Images of Carbon Nanosystems
Scanning tunneling microscopy (STM) is the only tool making it possible to study both the topography and electronic structure of carbon nanosystems in sub-nanometer resolution. The interpretation of the STM im...
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Book
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Chapter
Atomic Force Microscopy Investigation of Carbon Nanotubes
The basic principles of operation of atomic force microscopy (AFM), and the image formation mechanisms are discussed. In contact mode AFM the tip/sample interaction used to generate the image and to regulate t...
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Chapter
STM Investigation of Carbon Nanotubes
The general principles of scanning tunneling microscopy (STM) will be presented and their application to image interpretation will be discussed. The particular problems that may arise from the three dimensiona...
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Article
Y-branching of single walled carbon nanotubes
Y-branching was observed by scanning tunnelling microscopy (STM) in single wall carbon nanotubes grown by thermal decomposition of C60 fullerene in the presence of transition metals. These novel carbon nanostruct...
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Chapter
STM “Tip Changes” — A Possible Tool for Tip Characterization
A method based on the detailed analysis of STM tip changes is proposed for the investigation of tip cluster structure. As proposed by Mizes et al [2] the tunneling current for a multiple tip is considered to b...