Abstract
A method based on the detailed analysis of STM tip changes is proposed for the investigation of tip cluster structure. As proposed by Mizes et al [2] the tunneling current for a multiple tip is considered to be produced by the superposition of currents corresponding to the individual tip atoms. Good agreement is found between experimental results for Ptlr tips and computer simulations for a Pt15 [110] tip cluster. From the modification of the acquired image during imaging HOPG the modifications of the tip structure may be inferred.
PACS numbers: 73.40, 61.16, 68.35
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References
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© 1994 Springer Science+Business Media Dordrecht
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Biró, L.P., Márk, G.I., Balázs, E. (1994). STM “Tip Changes” — A Possible Tool for Tip Characterization. In: Hadjipanayis, G.C., Siegel, R.W. (eds) Nanophase Materials. NATO ASI Series, vol 260. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-1076-1_25
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DOI: https://doi.org/10.1007/978-94-011-1076-1_25
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