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  1. No Access

    Article

    Application of FTIR spectra for evaluating interfacial reactions in metal matrix composites

    Manufacturing of Saffil/MgLi metal matrix composites by the melt infiltration process is accompanied by extensive interfacial redox reaction between δ-Al2O3 fibers (Saffil) and lithium. The present paper deals wi...

    S. Kúdela Jr., S. Oswald, S. Kúdela, K. Wetzig in Analytical and Bioanalytical Chemistry (2008)

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    Article

    Radio frequency glow discharge source with integrated voltage and current probes used for sputtering rate and emission yield measurements at insulating samples

    Radio frequency glow discharge optical emission spectroscopy (RF-GD-OES) is routinely used for the chemical analysis of solid samples. Two independent electrical signals from the discharge are required for qua...

    L. Wilken, V. Hoffmann, K. Wetzig in Analytical and Bioanalytical Chemistry (2005)

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    Article

    Microstructure and composition of annealed Al/Ti-metallization layers

    Al/Ti multilayers with columnar grains were deposited by electron-beam evaporation on piezoelectric LiNbO3 substrates. After annealing in air and under vacuum conditions dissolution of the Ti interlayer was obser...

    M. Hofmann, T. Gemming, K. Wetzig in Analytical and Bioanalytical Chemistry (2004)

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    Article

    Comparison of the annealing behavior of thin Ta films deposited onto Si and SiO2 substrates

    Structural changes at annealing temperatures (T an) of 500–1,100°C were investigated for thin Ta films which were sputter-deposited onto pure Si substrates and onto thermally oxidized Si. In the as-deposited stat...

    R. Hübner, M. Hecker, N. Mattern, V. Hoffmann in Analytical and Bioanalytical Chemistry (2004)

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    Article

    Specific properties of fine SnO2 powders connected with surface segregation

    The effect of surface segregation in Sb- and In-doped SnO2 fine-grained powders has been analyzed in comparison with single-crystalline samples. The kinetics and thermodynamics of the Sb and In segregation proces...

    S. Oswald, G. Behr, D. Dobler, J. Werner in Analytical and Bioanalytical Chemistry (2004)

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    Article

    AES and SIMS investigation of diffusion barriers for copper metallization in power-SAW devices

    Barrier layers for Cu-metallization in surface acoustic wave (SAW) devices were investigated by AES and SIMS depth profiles. Two layered systems on LiNbO3 substrate have been analyzed after annealing in air up t...

    S. Baunack, S. Menzel, M. Pekarčíková, H. Schmidt in Analytical and Bioanalytical Chemistry (2003)

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    Article

    XPS investigations of thin tantalum films on a silicon surface

    Ultra thin tantalum-based diffusion barriers are of great interest in copper metallisation technology. Even the smallest amounts of copper that diffuse into the active silicon regions on a microprocessor will ...

    M. Zier, S. Oswald, R. Reiche, K. Wetzig in Analytical and Bioanalytical Chemistry (2003)

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    Article

    Nanostructure and thermoelectric properties of ReSi2±x thin films

    Anomalies in the nanostructure evolution of ReSi2±x thin films have proved to be of large interest in connection with their thermoelectric properties. By means of electron microscopic methods the correlation bet...

    J. Thomas, D. Hofman, C. Kleint, J. Schumann in Analytical and Bioanalytical Chemistry (2002)

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    Article

    Characterization of laser-irradiated YNi2B2C surfaces by Auger electron spectroscopy

    The suitability of laser ablation inductively coupled plasma mass spectrometry (LA–ICP–MS) for precise analysis of YNi2B2C has been investigated. The intensity ratios B/Y and Ni/Y were found to vary during ablat...

    S. Baunack, A. Plotnikov, R. Wrobel, C. Vogt in Analytical and Bioanalytical Chemistry (2002)

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    Article

    Calibration of XPS – energy scale for determination of the oxidation states of do** elements in SnO2 powders

    X-ray photoelectron spectroscopy (XPS) has been used to investigate the oxidation states of do** elements in doped SnO2 powders. Because of low conductivity, however, charging and resulting peak shift is obser...

    D. Dobler, S. Oswald, K. Wetzig in Analytical and Bioanalytical Chemistry (2002)

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    Article

    Morphology and structure of nanoscale Co-Cu multilayers

    Nanoscale cobalt-copper multilayers prepared by pulsed laser deposition on oxidized silicon substrate were investigated by means of transmission electron microscopic (TEM) methods combined with energy dispers...

    J. Thomas, K. Brand, A. A. Gorbunov in Fresenius' Journal of Analytical Chemistry (1999)

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    Article

    Bombardment-induced silicide formation at rhenium-silicon interfaces studied by XPS and TEM

    For further evaluation of photoemission properties of argon ion bombarded rhenium-silicon thin films pure element Re(21 nm) / Si(39 nm) / Re(21 nm) layer sandwiches were investigated on Si(111) substrates. TE...

    R. Reiche, S. Oswald, D. Hofman, J. Thomas in Fresenius' Journal of Analytical Chemistry (1999)

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    Article

    Chemical analysis of thin films by means of SS-MS, GD-OES, and XPS demonstrated at Ir-Si thermoelectrica

    Analytical methods with low detection limits were used for the investigation of Ir-Si thin films, the physical properties of which vary strongly with the chemical composition and the amount of impurities. It i...

    R. Kurt, V. Hoffmann, R. Reiche, W. Pitschke in Fresenius' Journal of Analytical Chemistry (1999)

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    Article

    In situ investigations of the thermal fatigue behaviour of hot pressed Si3N4 by laser shock loading inside an SEM

    The influence of both material microstructure and chemical composition of the grain boundary phase on subcritical crack growth under cyclic heat loading of hot pressed Si3N4 ceramics was investigated. The sample...

    Juliane Kadner, Siegfried Menzel, K. Wetzig in Fresenius' Journal of Analytical Chemistry (1998)

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    Article

    Investigation of the microstructure of IrSiX thin films

    The microstructure of sputtered IrSiX thin films was studied as a function of initial chemical composition and of annealing treatment. The films were investigated ex-situ by optical microscopy (OM) and transmiss...

    R. Kurt, W. Pitschke, J. Thomas, H. Wendrock in Fresenius' Journal of Analytical Chemistry (1998)

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    Article

    Investigation of argon ion bombarded RexSi1-x thin film composites by XPS, SEM and AES

    The electronic structure of argon ion bombarded RexSi1-x films (∼ 100 nm) were investigated by X-ray photoelectron spectroscopy. Argon ion bombardment leads to preferential sputtering of the silicon atoms and pr...

    R. Reiche, S. Oswald, H. Vinzelberg, C. Metz in Fresenius' Journal of Analytical Chemistry (1997)

  17. No Access

    Article

    Quantitative depth profiling of thin layers

    Foundations of sputtering profile evaluation are discussed, which allow the conversion of a measured sputtering profile, I = f(t), to a true element concentration profile celem. = f(z), or in special cases to a ...

    K. Wetzig, S. Baunack, V. Hoffmann, S. Oswald in Fresenius' Journal of Analytical Chemistry (1997)

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    Article

    New hardware for radio frequency powered glow discharge spectroscopies and its capabilities for analytical applications

    A new radio frequency (rf) hardware is developed for glow discharge spectroscopic methods. The resulting features and its capabilities for analytical applications are discussed. The electrical equipment develo...

    V. Hoffmann, H. -J. Uhlemann, F. Präßler in Fresenius' Journal of Analytical Chemistry (1996)

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    Article

    Thin film analysis in the nanometer scale

    A survey is presented on the present state of the art in analytical transmission electron microscopy (ATEM). An essential advantage of this method is the simultaneous use of imaging, analytical and microdiffra...

    K. Wetzig, Hans-Dietrich Bauer in Fresenius' Journal of Analytical Chemistry (1996)

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    Article

    Characterization of metallic and ceramic high-temperature materials for energy systems

    For the development of metallic and ceramic high temperature materials used, for example, in heat exchanger components, in turbine blades for stationary gas turbines, in ceramic industrial products and fusion ...

    H. Nickel, K. Wetzig in Fresenius' Journal of Analytical Chemistry (1994)

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