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Article
Improvement of the Electrical Performance of Ag/MEH-PPV/SiNWs Schottky Diode by the Insertion of a Thin Layer of MEH-PPV Polymer and Study of the Annealing Effect
Poly[2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV) thin layer was deposited on silicon nanowires (SiNWs) by electroless dip** method. SiNWs were obtained using Ag-assisted chemical etching...
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Article
Electrical characterisation of Ag/poly(3-hexylthiophene)/silicon nanowires Schottky diode
The electrical properties of Ag/Poly(3-hexylthiophene)/Silicon nanowires heterostructure (Ag/P3HT/SiNWs) were investigated. Silicon nanowires (SiNWs) were obtained by metal-assisted chemical etching method in ...
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Article
Modulation of electron transfer in Si/SiO2/HfO2/Graphene by the HfO2 thickness
We studied by Raman spectroscopy the effect of the variation of the thickness of the HfO2 layer in Si/SiO2/HfO2/Graphene heterostructures on the density of carrier transferred to graphene. Three thicknesses of th...
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Article
Physical investigations on LaMn1−xNixO3 perovskite sprayed thin films along with surface magnetic applications
This paper deals with the results on the structural, electrical, vibrational and optical properties of LaMn1−xNixO3 (0 ≤ x ≤ 0.3) thin films prepared by the spray pyrolysis technique on glass substrates at 460 °C...
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Article
Adsorbed Molecules and Surface Treatment Effect on Optical Properties of ZnO Nanowires Grown by MOCVD
We have investigated the optical properties of ZnO nanowires grown by metalorganic chemical vapor deposition (MOCVD) with nitrous oxide (N2O) as oxygen precursor. Photoluminescence (PL) and Raman measurements sho...
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Article
Observation and interpretation of the Tm 3+ free ion spectrum
The emission spectrum of thulium produced by a vacuum spark source was observed in the wavelength range from 700 to 2320 Å on the 10.7 m normal-incidence vacuum ultraviolet spectrograph at the Paris-Meudon...
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Article
Swelling of SiO2 Quartz Induced by Energetic Heavy Ions
A pronounced swelling effect occurs when irradiating SiO2 quartz with heavy ions (F, S, Cu, Kr, Xe, Ta, and Pb) in the electronic energy loss regime. Using a profilometer, the out-of-plane swelling was measured b...