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1. Ellipsometry

   Ellipsometry, in general, determines the complex ratio ρ of linearly independent electric feld components of polarized electromagnetic plane waves....

   Mathias Schubert in Infrared Ellipsometry on Semiconductor Layer Structures

   Chapter
   

2. Ellipsometry

   Ellipsometry is a very sensitiveEllipsometry|textbf technique for the detection of optical properties at surfaces, also getting information on the...

   Alexander Horn in The Physics of Laser Radiation–Matter Interaction

   Chapter 2022
   

3. Metasurface array for single-shot spectroscopic ellipsometry

   Spectroscopic ellipsometry is a potent method that is widely adopted for the measurement of thin film thickness and refractive index. Most...

   Shun Wen, **nyuan Xue, ... Yuanmu Yang in Light: Science & Applications

   Article Open access 10 April 2024
   

4. Magneto-Optic Ellipsometry

   The free-charge-carrier properties effective mass m, mobility μ, and carrier concentration N are of fundamental importance for understanding basic...

   Mathias Schubert in Infrared Ellipsometry on Semiconductor Layer Structures

   Chapter
   

5. Dynamic Spectroscopic Imaging Ellipsometry for Thickness Measurement Based on a Dual-Comb System

   Lightweight multifunctional devices, such as thin-film antennas and solar sails, are important for lightweight spacecraft development. The thickness...

   Ruixue Zhang, Guanhao Wu, ... Jian Ding in Proceedings of the 7th International Symposium of Space Optical Instruments and Applications

   Conference paper 2023
   

6. Optical properties of LaFeO₃ films studied using spectroscopic ellipsometry

   LaFeO ₃ film is an intermediate charge transfer/Mott–Hubbard insulator. LaFeO ₃ thin films were grown on SrTiO ₃ substrates using radio frequency...

   Jae Jun Lee, Da Hee Kim, ... Hosun Lee in Journal of the Korean Physical Society

   Article 01 March 2024
   

7. Generalized Null-Ellipsometry in the Polarizer–Sample–Analyzer Scheme

   Abstract

   The null ellipsometry technique of generalized ellipsometry based on using a compensator-free polarizer–sample–analyzer scheme for the case...

   M. V. Sopinskyy, G. P. Ol’khovik in Optics and Spectroscopy

   Article 01 February 2022
   

8. Phase-Spectral Ellipsometry Method for Nondestructive Control of the Chemical Composition of thin Metal-Oxide Heterostructures

   The problem of insufficient accuracy, informativeness and efficiency of recognition of the structure and composition of inhomogeneous surface layers...

   D. N. Tyurin, V. A. Kotenev in Measurement Techniques

   Article 01 November 2022
   

9. Investigation of Dielectric Functions of a Layer of Ag Nanoparticles on Silicon Using Spectro-Ellipsometry and Spectrophotometry

   Abstract

   An investigation of the optical characteristics of a layer of Ag nanoparticles deposited from an AgNO ₃ solution on the surface of...

   V. A. Tolmachev, Yu. A. Zharova, ... V. O. Bolshakov in Optics and Spectroscopy

   Article 01 January 2023
   

10. Spectroscopic ellipsometry studies of optical properties of TlIn(S_0.25Se_0.75)₂ crystal

    The optical properties of TlIn(S _0.25 Se _0.75 ) ₂ crystals were studied by ellipsometry measurements. X-ray diffraction pattern presented well-defined...

    I. Guler, M. Isik, N. Gasanly in Applied Physics A

    Article 23 May 2023
    

11. Ab Initio Calculations and Experimental Study of the Electronic Properties of CdGa₂Se₄ Single Crystals by Spectral Ellipsometry

    Abstract

    The electronic properties of CdGa ₂ Sе ₄ single crystals have been investigated experimentally using spectral ellipsometry and theoretically...

    I. A. Mamedova, Z. A. Jahangirli, ... N. A. Abdullayev in Physics of Wave Phenomena

    Article 27 October 2022
    

12. Investigation of dual intrinsic a-Si:H films for crystalline silicon surface passivation by spectroscopic ellipsometry: application in silicon heterojunction solar cells

    The microstructure factor ( R* ) of the PECVD-grown intrinsic amorphous silicon (i-a-Si:H) layer plays a crucial role in crystalline silicon (c-Si)...

    Ashutosh Pandey, Shrestha Bhattacharya, ... Vamsi Krishna Komarala in Applied Physics A

    Article 26 July 2023
    

13. Plasmonic structures for phase-sensitive ellipsometry biosensing: a review

    Plasmonic biosensing endeavors to offer the ultrasensitivity below 10 ⁻⁷ RIU along with providing a label-free platform for the detection of...

    Foozieh Sohrabi, Sajede Saeidifard, Seyedeh Mehri Hamidi in Optical and Quantum Electronics

    Article 15 November 2021
    

14. Determination of Optical Properties of MOVPE-Grown In_xGa_1-xAs/InP Epitaxial Structures by Spectroscopic Ellipsometry

    In _x Ga _1−x As epitaxial layers with different AsH ₃ flows have been grown on InP substrate with the MOVPE system. It has been found that AsH ₃ flow...

    Emine Kaynar, Muhammed Sayrac, ... Ilkay Demir in Brazilian Journal of Physics

    Article 24 August 2022
    

15. The Magneto-Optical Voigt Parameter from Magneto-Optical Ellipsometry Data for Multilayer Samples with Single Ferromagnetic Layer

    Abstract

    Calculations of the magneto-optical Voigt parameter Q were carried out using various models of reflecting media for thin films Fe|SiO ₂ |Si(100...

    O. Maximova, S. Lyaschenko, ... S. Ovchinnikov in Physics of the Solid State

    Article 01 October 2021
    

16. Machine learning powered ellipsometry

    Ellipsometry is a powerful method for determining both the optical constants and thickness of thin films. For decades, solutions to ill-posed inverse...

    **chao Liu, Di Zhang, ... **gjun Xu in Light: Science & Applications

    Article Open access 12 March 2021
    

17. Ellipsometry study on silicon nitride film with uneven thickness distribution by plasma-enhanced chemical vapor deposition

    As passivation layer and anti-reflection layer, silicon nitride (SiNx) thin film has been widely used in photovoltaic devices such as solar cells....

    Zhiqin Zhong, **ang Luo, ... Shaopeng Yang in Optical and Quantum Electronics

    Article 11 January 2023
    

18. Azimuthal angle dependent dielectric function of SnS by ellipsometry

    Since α-SnS has optically strong anisotropic characteristics, a simple method to determine its crystal orientation is strongly needed in device...

    Xuan Au Nguyen, Yong Woo Jung, ... Tae Jung Kim in Journal of the Korean Physical Society

    Article 15 December 2021
    

19. Ellipsometry of Metal Films under the Condition of Anomalous Skin Effect

    Abstract

    Fredholm integral equations of the second kind, which describe the fields of TE and TM polarized waves in metal films with allowance for the...

    A. B. Sotsky, E. A. Chudakov, L. I. Sotskaya in Optics and Spectroscopy

    Article 01 September 2021
    

20. Electronic structure analysis of a-Si: H  p-i₁-i₂-n solar cells  using ellipsometry spectroscopy

    In this study, we report an enhancement  in the efficiency of a-Si:H solar cells due to the addition of an intrinsic layer. The intrinsic layer of...

    Soni Prayogi, Yoyok Cahyono, D Darminto in Optical and Quantum Electronics

    Article 16 September 2022