Abstract
Ellipsometry, in general, determines the complex ratio ρ of linearly independent electric feld components of polarized electromagnetic plane waves. More specific, the change of the polarization state of an electromagnetic plane wave upon interaction with a sample is addressed thereby. Explicitly, for a given mode description in terms of, e.g., p and s polarized fields (amplitudes A stand for incident, B for exiting waves. Figure 2.1)1
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Schubert, M. Ellipsometry. In: Infrared Ellipsometry on Semiconductor Layer Structures. Springer Tracts in Modern Physics, vol 209. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-44701-6_2
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DOI: https://doi.org/10.1007/978-3-540-44701-6_2
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