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    Multiscale 3D characterization with dark-field x-ray microscopy

    Dark-field x-ray microscopy is a new way to three-dimensionally map lattice strain and orientation in crystalline matter. It is analogous to dark-field electron microscopy in that an objective lens magnifies d...

    Hugh Simons, Anders Clemen Jakobsen, Sonja Rosenlund Ahl, Carsten Detlefs… in MRS Bulletin (2016)