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  1. No Access

    Article

    Electron Paramagnetic Resonance in Semiconductors

    The use of electron paramagnetic resonance (EPR) in the study of defects in semiconductors is briefly reviewed, including group IV (C-diamond, Si, Ge, SiC), III-V (AlSb, GaAs, GaSb, GaP, InAs, InP, InSb), II-V...

    James W. Corbett, Richard L. Kleinhenz, Neal D. Wilsey in MRS Online Proceedings Library (2011)

  2. No Access

    Chapter and Conference Paper

    Characterization of impurities and defects by electron paramagnetic resonance and related techniques

    The use of electron paramagnetic resonance (EPR and ENDOR) in the study of defects in semiconductors is briefly reviewed, including group IV (C-diamond, Si, Ge, SiC), III-V (AlSb, GaAs, GaSb, GaP, InAs, InP, I...

    James W. Corbett, Richard L. Kleinhenz… in Defect Complexes in Semiconductor Structur… (1983)