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within P. J. Goodhew Remove this filter Electronics and Microelectronics, Instrumentation Remove this filter Measurement Science and Instrumentation Remove this filter Solid State Physics Remove this filter

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  1. No Access

    Chapter and Conference Paper

    Nanoanalysis of InAs/GaAs quantum dots using low-loss EELS spectra

    The elemental distribution in InAs/GaAs quantum dots has been analysed using the d transition edges in the imaginary part of the dielectric function, ɛ2(E), obtained from the electron energy loss spectrum from a ...

    A M Sánchez, M H Gass, A J Papworth, R Beanland… in Microscopy of Semiconducting Materials (2005)

  2. No Access

    Chapter and Conference Paper

    Changes in plasmon peak position in a GaAs/Tn0.2Ga0.8As structure

    We have investigated changes in the plasmon loss peak seen in electron energy loss spectra from a 15 nm In0.2Ga0.8As layer in GaAs using a VG HB601 UX FEG-STEM. We observe a relative shift in plasmon peak positio...

    R Beanland, A M Sánchez, A J Papworth, M H Gass… in Microscopy of Semiconducting Materials (2005)