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    Time-resolved in-situ X-ray diffraction study of the formation of 3D-hexagonal mesoporous silica films

    Highly oriented 3D-hexagonal silica thin films have been produced on silicon substrates by dip-coating technique, using cetyltrimethylammonium (CTAB) bromide as structuring agent. For the first time, time-reso...

    D. Grosso, P. A. Albouy, H. Amenitsch, A. R. Balkenende… in MRS Online Proceedings Library (2011)