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  1. No Access

    Article

    Ordinary and Extra-Ordinary Dielectric Function of 4h- and 6H-SiC in the 0.7 to 9.0 eV Photon Energy Range

    We report ordinary <ε⊥> and extra-ordinary <ε‖> dielectric function data of 4H- and 6H-SiC from 0.7 to 9.0 eV. These data, which were obtained by with spectroscopic ellipsometry, are in good qualitative agreement...

    O. P. A. Lindquist, K. Järrendahl, H. Arwin, S. Peters… in MRS Online Proceedings Library (2011)

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    Article

    Determination and Critical Assessment of the Optical Properties of Common Substrate Materials Used in III-V Nitride Heterostructures with Vacuum Ultraviolet Spectroscopic Ellipsometry

    As a first step toward enabling the in-line metrology of III-V nitride heterostructure and materials, we present the optical constants of the two common substrate materials over an unprecendented spectral rang...

    N.V. Edwards, O.P.A. Lindquist, L.D. Madsen, S. Zollner… in MRS Online Proceedings Library (2001)