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Article
Quantum dots of InAs/GaSb type II superlattice for infrared sensing
Throughout the past years, significant progress has been made in Type II (InAs/GaSb) photovoltaic detectors in both LWIR and VLWIR ranges. BLIP performance at 60K for 16μm photovoltaic type II detectors has be...
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Article
Epitaxial Growth of Aluminum Nitride on Sapphire and Silicon
The microstructural characteristics of wide band gap semiconductor, hexagonal A1N thin films on Si(100), (111), and sapphire (0001) and (10ī2) were studied by transmission electron microscopy (TEM) and x-ray d...
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Article
Study of Thin Films Polarity of Group III Nitrides
Thin films of GaN grown by MOCVD on (0001) sapphire were studied by transmission electron microscopy in order to correlate the observed extended defects with crystal polarity of the films. We propose relativel...
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Article
Study of Thin films Polarity of Group III Nitrides
Thin films of GaN grown by MOCVD on (0001) sapphire were studied by transmission electron microscopy in order to correlate the observed extended defects with crystal polarity of the films. We propose relativel...
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Article
GaInN/GaN Multi-Quantum Well Laser Diodes Grown by Low-Pressure Metalorganic Chemical Vapor Deposition
We report the growth, fabrication and characterization of GaInN/GaN multi-quantum well lasers grown on (00.1) sapphire substrates by low pressure metalorganic chemical vapor deposition. The threshold current d...
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Article
Comparative Study of Typical Defects in III-Nitride Thin Films and Their Alloys
The microstructure and typical defects in GaN and GaN/GaAlN thin film heterostructures grown on (0001)α-A12O3 were investigated using different transmission electron microscopy (TEM) techniques including diffract...
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Article
AlxGa1−xN-Based Materials and Heterostructures
We present the metalorganic chemical vapor deposition growth, n-type and p-type do** and characterization of AlxGa1−xN alloys on sapphire substrates. We report the fabrication of Bragg reflectors and the demons...
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Article
High Resolution X-ray Diffraction of GaN Grown on Sapphire Substrates
X-ray rocking curves are frequently used to assess the structural quality of GaN thin films. In order to understand the information given by the line shape, we need to know the primary mechanism by which the c...
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Article
InSb Detectors and Focal Plane Arrays on GaAs, Si, and Al203 Substrates
In this paper, we report on the growth and fabrication of InSb detectors and Focal Plane Arrays (FPA’s) on (100) Si, Al203, and (100) and (111) GaAs substrates for infrared (IR) imaging. Several advantages result...
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Article
High Power InAsSb/InAsSbP Laser Diodes Emitting at 3 ∼ 5 μm Range
We report metalorganic chemical vapor deposition-grown double heterostructure and multiple quantum well InAsSb/InAsSbP laser diodes emitting at 3 to 4 μm and light emitting diodes up to 5 μm. Maximum output po...
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Article
GaAs/GaInP Quantum Well Intersubband Photodetectors for Focal Plane Array Infrared Imaging
We demonstrate long wavelength quantum well infrared photodetectors (QWIP) with GaAs quantum wells and GalnP barriers grown using gas-source molecular beam epitaxy. Wafers were grown with varying well widths. ...
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Article
Growth and Characterization of BRS GaInAsP-GaAs Laser Emitting at 0.8µm by Gas-Source Molecular Beam Epitaxy
GaInAsP-GaAs buried ridge structure lasers emitting at 0.8µm have been fabricated on material grown in two steps by low pressure metalorganic chemical vapor deposition and gas-source molecular beam epitaxy. Pr...
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Article
Growth of GaN without Yellow Luminescence
We report the growth and photoluminescence characterization of GaN grown on different substrates and under different growth conditions using metalorganic chemical vapor deposition. The deep-level yellow lumine...
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Article
Spectral Response of GaN P-N Junction Photovoltaic Structures
GaN ultraviolet photovoltaic and photoconductive detectors were grown on sapphire substrates by metalorganic chemical vapor deposition. The spectral response was analyzed considering the detector structure of ...
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Article
The Microstructural Study of Aluminum Nitride Thin Films: Epitaxy on the Two Orientations of Sapphire and Texturing on Si
The microstructural study of wide-band gap semiconductor AlN thin films grown on (0001) and (1012) sapphire and (111), (100) Si was carried out using plan-view and cross-sectional high-resolution electron micr...
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Article
High-Quality InSb Growth on GaAs and Si by Low-Pressure Metalorganic Chemical Vapor Deposition
We report the first InSb film growth on Si by low-pressure metalorganic chemical vapor deposition. High-quality layers of InSb have been grown on Si and GaAs substrates. InSb films displayed mirror-like morpho...
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Article
Growth of InSb/GaAs Layers on YIG-Coated GGG Substrate
We report the first growth of InSb and GaAs epilayers upon a garnet (YIG = Y3Fe5O12) epilayer. The YIG was deposited using liquid phase epitaxy on a garnet (GGG = Gd3Ga5O12) substrate oriented in the {xc111} dire...
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Article
Optical, Electrical, and Structural Characterization of GaInAsP/InP Layers Grown on Silicon Substrate for 1.35 μm Laser Applications
A 1.35 μ wavelength GaInAsP / InP double heterostructure laser has been grown on Si substrate by low-pressure metalorganic chemical vapor deposition. The layers are grown directly on Si substrate coated with G...
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Article
Low Pressure Mocvd Growth and Characterization of GaAs and InP on Silicon Substrates
High quality GaAs and InP have been grown on silicon substrates, using low pressure metalorganic chemical vapor deposition technique. The growth temperature is 550ºC andthe growth rate 100 A/min.
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Article
Low Pressure MOCVD Growth and Characterization of GaAs and InP on Silicon Substrates
High quality GaAs and InP have been grown on silicon substrates, using low pressure metalorganic chemical vapor deposition technique. The growth temperature is 550°C and the growth rate 100 A/min.