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  1. No Access

    Article

    Thermal Conductivity Measurements of Thin Amorphous Silicon Films by Scanning Thermal Microscopy

    Thermal conductivity measurements of thin amorphous silicon films performed with a micro-thermistance mounted on an atomic force microscope are presented. A specific thermal model is implemented, and an identi...

    S. Volz, X. Feng, C. Fuentes, P. Guérin… in International Journal of Thermophysics (2002)

  2. No Access

    Article

    Stability of the nitrogen-deficient Ti2AlN x MAX phase in Ar2+-irradiated (Ti,Al)N/Ti2AlN x multilayers

    The effects of 100 keV Ar2+ ion irradiation on the structure and stability of multilayered dc sputtered and annealed thin films of (Ti,Al)N/Ti2AlN x have been investigated with ...

    M. Bugnet, T. Cabioc’h, V. Mauchamp, Ph. Guérin, M. Marteau… in Journal of Materials Science (2010)