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  1. No Access

    Article

    Growth stresses and viscosity of thermal oxides on silicon and polysilicon

    Stresses in thermally grown SiO2 films on silicon have traditionally been determined by substrate curvature measurements. This technique is useful for studying stresses in thin films, but it cannot be used to inv...

    H. Kahn, N. **g, M. Huh, A. H. Heuer in Journal of Materials Research (2006)

  2. No Access

    Article

    Scrub Typhus Pneumonitis Acquired through the Respiratory Tract in a Laboratory Worker

    M. Oh, N. Kim, M. Huh, C. Choi, E. Lee, I. Kim, K. Choe in Infection (2001)