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    Quantitative analysis of screw dislocations in 6H−SiC single crystals

    Screw dislocations along the [0001] axis in 6H−SiC single crystals have been studied extensively by Synchrotron White-Beam X-ray Topography (SWBXT), Scanning Electron Microscopy (SEM), and Nomarski Optical Mic...

    M. Dudley, W. Si, S. Wang, C. Carter, R. Glass, V. Tsvetkov in Il Nuovo Cimento D (1997)