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    Chapter and Conference Paper

    Measurement of field-emission properties of a single crystal silicon emitter using scanning electron microscopy

    Comparison of field emission properties between a single crystal silicon emitter and a silicon emitter array are investigated in this letter by utilizing scanning electron microscopy (SEM) and a small tungsten...

    T C Cheng, H T Hsueh, W J Huang, M N Chang… in Microscopy of Semiconducting Materials (2005)