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Article
The Effect of AlN Buffer Layer Morphology on the Structural Quality of a Semipolar GaN Layer Grown on a Si(001) Substrate, According to Transmission Electron Microscopy Data
Structural features of the interface between a semipolar gallium nitride layer and buffer layer of aluminum nitride grown on a SiC/Si(001) template misoriented by an angle of 7° were studied by high-resolution...
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Article
Structural Characterization of a Short-Period Superlattice Based on the CdF2/CaF2/Si(111) Heterostructure by Transmission Electron Microscopy and X-Ray Diffractometry
A detailed study of the structure of a short-period superlattice based on alternating layers of cadmium and calcium fluorides grown by molecular beam epitaxy on a silicon substrate (111) by transmission electr...
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Article
A TEM Study of AlN–AlGaN–GaN Multilayer Buffer Structures on Silicon Substrates
Two buffer structures based on AlxGa1 – xN solutions with silicon do** and without it have been studied by transmission electron microscopy. The structures have been grown on silicon substrates with the (111) o...
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Article
Third International Conference “Physics for Life Sciences” Study of Dentin Structural Features by Computed Microtomography and Transmission Electron Microscopy
Dentin in the human tooth is a natural composite material with a complex multilevel hierarchical structure and consists of micro and nanostructures that are related to each other in a complex interrelation gov...
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Article
An Increase of Threading Dislocations Filtering Efficiency in Al2O3 Templates with Faceted Surface Morphology During a Growth by Molecular Beam Epitaxy
We present the results of a transmission electron microscopy and X-ray diffractometry investigation of AlN/c-Al2O3 templates with GaN ultrathin insertions grown by plasma-assisted molecular beam epitaxy. It has b...
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Article
Dislocation Reactions in a Semipolar Gallium Nitride Layer Grown on a Vicinal Si(001) Substrate Using Aluminum Nitride and 3C–SiC Buffer Layers
Transmission electron microscopy was used to study the interaction of a + c and a dislocations in a thick (14 μm) semipolar GaN layer grown by hydride vapor phase epitaxy on a 3C-SiC/Si(001) template. It is shown...
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Article
Microstructure of Si Crystals Subjected to Irradiation with High-Energy H+ Ions and Heat Treatment by High-Resolution Three-Crystal X-Ray Diffraction and Transmission Electron Microscopy
The structural features of the formation of radiation defects in proton-implanted layers of silicon plates during their heat treatment have been studied. New data on the nature, the characteristics, and the mi...
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Article
On Change in the Silicon Crystal Structure Implanted with Hydrogen Ions during Annealing Based on Three-Crystal X-Ray Diffractometry Data
In this paper, we present the results of a three-crystal X-ray diffractometry (XRD) study of the state of a disturbed layer formed in silicon crystals by implantation of hydrogen ions with energies of 100 + 20...
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Article
Electrical and Magnetic Properties of Pb and In Nanofilaments in Asbestos near the Superconducting Transition
Bulk nanocomposites based on superconducting metals Pb and In embedded into matrices of natural chrysotile asbestos with the nanotube internal diameter d ~ 6 nm have been fabricated and studied. The low-temperatu...
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Article
Asymmetry of the Defect Structure of Semipolar GaN Grown on Si(001)
The defect structure of a thick (~15 μm) semipolar gallium nitride (GaN) layer grown by hydride–chloride vapor phase epitaxy on a Si(001) substrate with buffer layers has been studied by transmission electron ...
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Chapter and Conference Paper
TEM Investigation of Nanostructures with a High Aspect Ratio
In this work, we intend to demonstrate an essential role that can play a TEM investigation of cross-sections of HAR nanostructures for a characterization of their internal structure and surface morphology. For...
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Article
Development of a spinodal decomposition model for the example of a heterostructure based on silicon carbide polytypes
The transition region of a 3C-SiC/4H-SiC heterostructure constituted by layers of the 3C and 4H polytypes has been studied. A previously proposed spinodal decomposition model was used to estimate the thickness ra...
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Article
Optical properties of metal nanoparticles in chrysotile channels
Chrysotile samples with macroscopically ordered channels filled by gold and silver have been studied using optical transmission spectroscopy. The channels had inner diameters below 5 nm and lengths up to about...
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Article
Size effects in electrical and magnetic properties of quasi-one-dimensional tin wires in asbestos
Bulk composites have been prepared based on one-dimensional fibers of natural chrisothil-asbestos with various internal diameters (d = 6–2.5 nm) filled with tin. The electrical and magnetic properties of quasi-on...
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Article
Fabrication of quasi-superlattices at the interface between 3C-SiC epitaxial layer and substrates of hexagonal SiC polytypes by sublimation epitaxy in vacuum
Transmission electron microscopy has been used to study the structure of a transition layer between a hexagonal substrate (6H-SiC and 4H-SiC) and a cubic silicon carbide layer grown by sublimation epitaxy in vacu...
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Article
Growth and structure of GaN layers on silicon carbide synthesized on a Si substrate by the substitution of atoms: A model of the formation of V-defects during the growth of GaN
This paper presents the results of the electron microscopic study of GaN/AlGaN/AlN/SiC/Si(111) structures grown by the metal-organic vapor phase epitaxy. A SiC epitaxial buffer nanolayer has been grown by a ne...
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Article
Electron-microscopic study of Sn-chrisotile asbestos nanocomposite
Transmission electron microscopy was used to study the structural state of tin in Sn-chrisotile asbestos nanocomposite. It is shown that tin in the nanocomposite forms a system of nanowires, which, in turn, co...
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Article
Investigation of the transition layer in 3C-SiC/6H-SiC heterostructures
Transmission electron microscopy and the cathodoluminescence method are used to study the transition region in 3C-SiC/6H-SiC heterostructures. It is shown that this region is, as a rule, constituted by alternatin...
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Article
Sequential structural characterization of layers in the GaN/AlN/SiC/Si(111) system by X-ray diffraction upon every growth stage
X-ray diffraction and transmission electron microscopy techniques have been used to study the dynamics of variation of the structural characteristics and deformation state in SiC, AlN, and GaN epilayers sequen...
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Article
Structural and optical properties of porous silicon prepared from a p +-epitaxial layer on n-Si(111)
The structural and optical properties of porous silicon prepared by anodic etching of an n-Si(111) wafer with a p +-homoepitaxial layer on one side are studied by scanning electron microscopy and ...