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Article
Open AccessMutations of IFT81, encoding an IFT-B core protein, as a rare cause of a ciliopathy
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Article
Interface studies on magnetron-sputtered SnO2-films
Thin SnO2 films have been prepared for H2-gas sensor application by RF magnetron sputtering onto different SiO2 based glasses. ARXPS and sputter-AES measurements have been performed to evaluate the compounds at S...
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Article
ARXPS-analysis and morphology of sputtered nanocrystalline TiC/SiC coatings
ARXPS (angle resolved X-ray photoelectron spectroscopy) measurements are used to obtain informations about surfaces and grain boundaries. Data acquired from nanocrystalline carbidic hard coatings have been emp...
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Article
ARXPS-analysis of sputtered TiC, SiC and Ti0.5Si0.5C layers
TiC, SiC and Ti0.5Si0.5C layers have been deposited by magnetron sputtering in Argon at bias voltages between 0 and 1500 V. AES and ARXPS analyses show that TiC and Ti0.5Si0.5C, at bias voltages below 1000 V, are...
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Article
ARXPS — Studies of nucleation and make-up of sputtered TiN-layers
Hardness, high density and small crystal size of sputtered TiN coatings yield protective layers, with, e.g., enhanced wear resistance. The properties of these layers depend crucially on their chemical and stru...
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Article
On the identification of interface oxides and interface serration by ARXPS
Oxidized surfaces show smeared out XPS lines which cannot be fitted by bulk compounds and by lateral growth. By simultaneously fitting XPS spectra obtained for take-off angles between 5 ° and 80 ° the resoluti...