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  1. Article

    Open Access

    Mutations of IFT81, encoding an IFT-B core protein, as a rare cause of a ciliopathy

    I Perrault, J Halbritter, J Porath, X Gerard, D Braun, H Gee, H Fathy, S Saunier… in Cilia (2015)

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  2. No Access

    Article

    Interface studies on magnetron-sputtered SnO2-films

    Thin SnO2 films have been prepared for H2-gas sensor application by RF magnetron sputtering onto different SiO2 based glasses. ARXPS and sputter-AES measurements have been performed to evaluate the compounds at S...

    H.-J. Michel, H. Leiste, E. Nold… in Fresenius' Journal of Analytical Chemistry (1995)

  3. No Access

    Article

    ARXPS-analysis and morphology of sputtered nanocrystalline TiC/SiC coatings

    ARXPS (angle resolved X-ray photoelectron spectroscopy) measurements are used to obtain informations about surfaces and grain boundaries. Data acquired from nanocrystalline carbidic hard coatings have been emp...

    B. Hornetz, H.-J. Michel, J. Halbritter in Fresenius' Journal of Analytical Chemistry (1994)

  4. No Access

    Article

    ARXPS-analysis of sputtered TiC, SiC and Ti0.5Si0.5C layers

    TiC, SiC and Ti0.5Si0.5C layers have been deposited by magnetron sputtering in Argon at bias voltages between 0 and 1500 V. AES and ARXPS analyses show that TiC and Ti0.5Si0.5C, at bias voltages below 1000 V, are...

    V. Schier, H. -J. Michel, J. Halbritter in Fresenius' Journal of Analytical Chemistry (1993)

  5. No Access

    Article

    ARXPS — Studies of nucleation and make-up of sputtered TiN-layers

    Hardness, high density and small crystal size of sputtered TiN coatings yield protective layers, with, e.g., enhanced wear resistance. The properties of these layers depend crucially on their chemical and stru...

    J. Halbritter, H. Leiste, H. J. Mathes… in Fresenius' Journal of Analytical Chemistry (1991)

  6. No Access

    Article

    On the identification of interface oxides and interface serration by ARXPS

    Oxidized surfaces show smeared out XPS lines which cannot be fitted by bulk compounds and by lateral growth. By simultaneously fitting XPS spectra obtained for take-off angles between 5 ° and 80 ° the resoluti...

    A. Darlinski, J. Halbritter in Fresenius' Zeitschrift für analytische Chemie (1987)