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Article
An Influence of Mechanical Stresses on the Magnitude of the Internal Field in Lead Zirconate Titanate Thin Films
In self-polarized lead zirconate titanate thin films formed on platinized silicon substrates, a significant increase in the internal electric field was observed as a result of long-term aging. To explain this ...
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Article
Microstructure and Dielectric Properties of Thin Polycrystalline PZT Films with Inhomogeneous Distribution of the Composition over Thickness
The RF magnetron sputtering of a PZT ceramic target with a variation in the pressure of the working gas is used to form two two-layer thin-film structures differing in the sequence of layer deposition: structu...
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Article
Dielectric and Pyroelectric Properties of Composites Based on Aluminum and Gallium Nitrides Grown by Chloride-Hydride Epitaxy on a Silicon Carbide-on-Silicon Substrate
We studied the microstructure and the dielectric and pyroelectric properties of AlxGa1 – xN composite epitaxial layers grown on SiC/Si(111) substrates by chloride-hydride epitaxy. The phenomenon of spontaneous (i...
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Article
Quasi-Stationary Processes of the Dielectric Relaxation in Polycrystalline Thin PZT Films
The relaxation processes in polycrystalline PZT films formed on silicon substrates have been studied during a quasi-static change in an external electric field. The dielectric relaxation is shown to be charact...
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Article
Nonlinear Optical Diagnostics of Thin Polycrystalline Lead Zirconate Titanate Films
Nonlinear optical microscopy techniques have been used to study thin films of single-phase (perovskite) and two-phase (perovskite–pyrochlore) lead zirconate titanate (PZT) deposited on Pt/TiO2/SiO2/Si by means of...
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Article
Influence of Orientation of a Silicon Substrate with a Buffer Silicon Carbide Layer on Dielectric and Polar Properties of Aluminum Nitride Films
Dielectric and polar properties of aluminum nitride (AlN) thin films epitaxially grown on differently oriented silicon substrates with the p-type conduction and a buffer silicon carbide (SiC) layer and on vicinal...
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Article
Surface Morphology, Microstructure, and Piezoelectric Response of Perovskite Islands in Lead Zirconate Titanate Thin Films
Features of the microstructure and piezoelectric response of perovskite islands in a pyrochlore phase matrix in lead zirconate titanate thin films prepeared by the radio-frequency magnetron sputtering method a...
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Article
Peculiarities of the Structure and Properties of Thin PZT Films with Strongly Nonuniform Depth–Composition Profiles
Two-layer thin films of lead zirconate titanate (PZT) with lead content in the layers differing by 20% were deposited by RF magnetron sputtering at variable working gas pressure in the system. The phase states...
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Article
The Element Composition Variation in Lead Zirconate Titanate upon the Ion-Plasma Deposition: Experiment and Simulation
The element composition modification is experimentally studied in PZT thin films obtained via the RF magnetron sputtering with variable working gas pressure. The experimental data were interpreted through the ...
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Article
Studying the Composition and Phase State of Thin PZT Films Obtained by High-Frequency Magnetron Sputtering under Variation of Working Gas Pressure
Variation of the working gas pressure (from 8 to 2 Pa) during RF magnetron sputtering deposition of thin perovskite lead zirconate titanate (PZT) films revealed strong changes in their lead content, which decr...
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Article
Microstructure, phase analysis and dielectric response of thin Pb(Zr,Ti)O3 films at the morphotropic phase boundary
The phase state of lead-zirconate-titanate thin films, obtained by a two-stage technology, at the morphotropic phase boundary is studied by electron backscatter diffraction and by measuring the temperature dep...
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Article
Influence of high-temperature annealing on the orientation of the unipolarity vector in lead zirconate titanate thin films
The factors responsible for the change in the orientation of the natural unipolarity vector due to heating to the Curie temperature of a Pt/PZT/Pt thin-film capacitor (PZT—lead zirconate titanate) formed on a TiO
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Article
Pyroelectric and piezoelectric responses of thin AlN films epitaxy-grown on a SiC/Si substrate
This paper presents the results of pyroelectric and piezoelectric studies of AlN films formed by chloride–hydride epitaxy (CHE) and molecular beam epitaxy (MBE) on epitaxial SiC nanolayers grown on Si by the a...
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Article
Ferroelectric films of barium strontium titanate on semi-insulating silicon carbide substrates
Thin ferroelectric Ba x Sr1–x TiO3 (BST) layers have been grown for the first time on semi-insulating silicon carbide substrates by RF magnetron s...
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Article
The structure and dielectric properties of thin barium zirconate titanate films obtained by RF magnetron sputtering
Submicron thin layers of BaZr x Ti1–x O3 are grown in-situ by RF magnetron sputtering of a ceramic target (x = 0.50) on a substrate of Pt/r-cut le...
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Article
Internal field and self-polarization in lead zirconate titanate thin films
It has been shown that 300-nm-thick polycrystalline films of lead zirconate titanate (PZT), the compositions of which correspond to the region of morphotropic phase boundary, undergo anomalous changes in the c...
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Article
Nonlinear optical diagnostics of local crystallization of lead zirconate titanate films using femtosecond laser radiation
Features of crystallization of microstructures to the perovskite-like phase in a lead zirconate titanate film are studied using multiple near-IR femtosecond laser pulse radiation. The kinetics of crystallizati...
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Article
Relaxor properties of single crystals of Na1/2Bi1/2TiO3-KTaO3 solid solutions
Single crystals of Na1/2Bi1/2TiO3-KTaO3 (NBT-KT) solid solutions have been grown for the first time. The elemental composition of as-grown single crystals determined by X-ray diffraction corresponds to 0.81 NBT-0...
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Article
Pyroelectric and piezoelectric properties of thin PZT films at the morphotropic phase boundary
It has been shown that, in polycrystalline thin PZT films with the Zr/Ti = 0.535/0.465 ratio of ions in octahedral positions of the perovskite structure, the permittivity and the pyroelectric and piezoelectric...
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Article
Conductivity and barrier effects in thin-film PZT-based heterostructures, depending on the conditions of synthesis
Electrical conductivity and dielectric characteristics in Pt/Pb(Zr0.54,Ti0.46)O3/Pt film structures synthesized at different temperatures are studied. Volt-ampere (I–V) and volt-farad (C–V) characteristics are ob...