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A study of the effect of residual stress on magnetic properties of Fe-Ni thin film using a synchrotron X-ray
Fe20Ni80 thin films, with a thickness of 0.7 μm, were sputtered onto Si (111) single crystal and 40-μm thick Ni79Fe21 ribbons were fabricated using the rapid solidification process (RSP). Annealing of Ni-Fe thin ...